2007
DOI: 10.1002/mop.22442
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THz characterization of high dielectric‐constant materials using double‐layer sample

Abstract: The super-hyper singular integrals in the EFIE of the second form in Eq. (1) were prohibitive and there was no direct way to evaluate them. But we have developed a novel technique to efficiently handle such singularities based on the series representation of the Green's function and a constant current approximation. The approach allows us to solve the EFIE of the second form directly. It has locality in its unknown association with space, and hence is easy to incorporate with FMA. The derived closed-form formu… Show more

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Cited by 11 publications
(21 citation statements)
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“…It has long been known from microwave measurements that transmission measurements are more stable and provide information on the whole volume of the sample under test [15,[29][30][31]. In this paper, our aim is to propose a measurement method and a fast retrieval algorithm for relative complex permittivity (ε r ) measurements of lossy materials using transmission properties of a BWO set-up operating at mm-and THz frequencies, because of the attractive features of BWO oscillators just discussed.…”
Section: Introductionmentioning
confidence: 99%
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“…It has long been known from microwave measurements that transmission measurements are more stable and provide information on the whole volume of the sample under test [15,[29][30][31]. In this paper, our aim is to propose a measurement method and a fast retrieval algorithm for relative complex permittivity (ε r ) measurements of lossy materials using transmission properties of a BWO set-up operating at mm-and THz frequencies, because of the attractive features of BWO oscillators just discussed.…”
Section: Introductionmentioning
confidence: 99%
“…A plethora of potential application scenarios are foreseen for mm-waves and THz spectroscopy systems. Applications include non-destructive testing of industrial processes and products [3] and of cultural heritage [4], detection of hazardous materials and concealed weapons [5], and so on [6][7][8][9][10][11][12][13], and measurement of lowloss dielectric materials which are now of increasing importance in the design of circuit components and quasi-optical elements such as multilayer filters, dielectric (or semiconductor) windows, beam splitters and absorbers, switches, and directional couplers [14][15][16].…”
Section: Introductionmentioning
confidence: 99%
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