2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) 2022
DOI: 10.1109/vlsid2022.2022.00062
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Threshold Voltage Modeling of Negative Capacitance Double Gate TFET

U S Shikha
1
,
Rekha K. James
2
,
Anju Pradeep
3
et al.
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