2018
DOI: 10.1021/acsami.8b12346
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Threshold Voltage Control in Organic Field-Effect Transistors by Surface Doping with a Fluorinated Alkylsilane

Abstract: Doping is a powerful tool to control the majority charge carrier density in organic field-effect transistors and the threshold voltage of these devices. Here, a surface doping approach is shown, where the dopant is deposited on the prefabricated polycrystalline semiconducting layer. In this study, (tridecafluoro-1,1,2,2-tetrahydrooctyl)trichlorosilane (FTCS), a fluorinated alkylsilane is used as a dopant, which is solution processable and much cheaper than conventional p-type dopants, such as 2,3,5,6-tetrafluo… Show more

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Cited by 22 publications
(18 citation statements)
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“…When positive bias is applied, the electrons are trapped at the DPP-DTT-O 2 complex. These trapped electrons induce p-doping, which can cause the positive shift of the threshold voltage [34]. In contrast, the V TH is observed to return towards zero voltage (negative direction), as the width of the pattern decreases, as shown in Figure 6b.…”
Section: Resultsmentioning
confidence: 95%
“…When positive bias is applied, the electrons are trapped at the DPP-DTT-O 2 complex. These trapped electrons induce p-doping, which can cause the positive shift of the threshold voltage [34]. In contrast, the V TH is observed to return towards zero voltage (negative direction), as the width of the pattern decreases, as shown in Figure 6b.…”
Section: Resultsmentioning
confidence: 95%
“…Both the low-frequency C – f behavior and the direct current (DC) conductivity measurements on glass (Figure S4) suggest that additional mobile carriers exist at the TIPS-pentacene/InO x interface without needing to be electrostatically induced by a V G . It is well known that additional mobile charge carriers at the oxide interface have a significant impact on transistor V TH − and could thus naturally explain even a large shift of V TH as observed for the TCETFTs. However, if we attribute such mobile carriers to the TIPS-pentacene/InO x interface, then the following question would remain: why V TH of the EETFTs is not also very negative?…”
Section: Resultsmentioning
confidence: 96%
“…The decrease of I ON/OFF is primarily attributed to the significant increase in the device off current, which is a natural result of doping. [ 20,42,56,57 ]…”
Section: Resultsmentioning
confidence: 99%