2019
DOI: 10.1364/oe.27.008890
|View full text |Cite
|
Sign up to set email alerts
|

Three-wavelength passive demodulation technique for the interrogation of EFPI sensors with arbitrary cavity length

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
12
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 35 publications
(12 citation statements)
references
References 16 publications
0
12
0
Order By: Relevance
“…This part introduces and illustrates the numerical model of the transmitted blue light and converted yellow light in the double-layer phosphor structure, from which changes can be made to create immense enhancement to LED efficiency. The blue light transmission and the conversion of yellow light in single layer remote phosphor package with the phosphor layer thickness of 2h expressed as ( 1) and ( 2) [21][22][23][24][25][26].…”
Section: Resultsmentioning
confidence: 99%
“…This part introduces and illustrates the numerical model of the transmitted blue light and converted yellow light in the double-layer phosphor structure, from which changes can be made to create immense enhancement to LED efficiency. The blue light transmission and the conversion of yellow light in single layer remote phosphor package with the phosphor layer thickness of 2h expressed as ( 1) and ( 2) [21][22][23][24][25][26].…”
Section: Resultsmentioning
confidence: 99%
“…As shown in Figure 1(A)~(D), passive quadrature phase retrieval can be achieved by multiple wavelength, 19,20,34,38–40 and also by dual F‐P cavity, 35,41 birefringence crystal, 36,42 and 2*2 coupler 37 . Passive quadrature phase demodulation schemes have high stability.…”
Section: Fast Interrogation Techniquesmentioning
confidence: 99%
“…However, in actual applications, the A might change, bringing inaccurate demodulation results. Three‐wavelength quadrature demodulation technology can eliminate the demodulation error caused by the change of the DC value, 34 so as to achieve a higher stability.…”
Section: Fast Interrogation Techniquesmentioning
confidence: 99%
“…Beside the structure configuration that hugely affects the outcome of light, the attention should also be on the amount of phosphor materials presents in the device. Evidently, the light loss that damages the lighting efficiency and often appears in low CCTs WLEDs increases with the concentration of phosphor material [16]. Other possible causes for reduced luminous flux that have been pointed out by other research are high scattering and reflecting.…”
Section: Introductionmentioning
confidence: 96%