Three-intensity measurement technique and its measurement in elliptical retarder

Lin, P.L.; Han, Chien-Yuan; Chao, Yu–Faye

doi:10.1016/j.optcom.2008.02.042

Cited by 9 publications

(9 citation statements)

References 6 publications

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“…An elliptical retarder is not only of great theoretical significance, but also occurs frequently in practice. For example, certain crystals [4], combinations of linear retarders [4][5][6], twisted nematic liquid crystal cells [7], birefringence behavior of an optical fiber [8,9], transparent birefringent mask [10] can all be treated as elliptical retarders.…”

Section: Introductionmentioning

confidence: 99%

A Simple Graphic Method for Analyzing the Polarization State of an Optical System With a Fixed Polarizer and a Rotating Elliptical Retarder

Wang¹,

He²

2022

PIER

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The trajectory of the polarization state of a monochromatic beam passing through a fixed linear polarizer and a rotating elliptical retarder on the Poincaré sphere is found to be a threedimensional 8-shaped contour, which is determined as the line of intersection of a right-circular cylinder with the Poincaré sphere. The cylinder is parallel to the S 3 axis, and the projection of the contour on the S 1 S 2 plane is a circle whose center and radius are determined. A method of projecting the three-dimensional geometric relationships to the two-dimensional S 1 S 2 plane to locate the position of the polarization state of the emerging beam on the Poincaré sphere for a given azimuth of the elliptical retarder is presented, and applied to solve a problem of polarization optics. The proposed graphic method substantially simplifies the polarization state analysis involving elliptical retarders.

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Section: Introductionmentioning

confidence: 99%

A Simple Graphic Method for Analyzing the Polarization State of an Optical System With a Fixed Polarizer and a Rotating Elliptical Retarder

Wang¹,

He²

2022

PIER

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“…The Senarmont method needs the fast axis of the sample to be set 45°relative to the polarization direction of the polarizer, so it cannot measure the fast axis azimuth either. The intensity determination method [5][6][7] needs to rotate the retarder or the polarizer to obtain a series of related intensity signals. By analyzing these signals, the retardation and fast axis azimuth can be obtained.…”

Section: Introductionmentioning

confidence: 99%

Real-time measurement of retardation and fast axis azimuth for wave plates

et al. 2015

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Real-time measurement of retardation and fast axis azimuth of wave plates is proposed. The light emitted from the laser passes through a circular polarizer and the sample successively. Then the beam is diffracted to three sub-beams by a grating. One sub-beam passes through a standard quarter-wave plate and then is split and analyzed by a Wollaston prism. The other two sub-beams are all directly split and analyzed by Wollaston prisms. Six intensities are simultaneously detected to calculate the retardation and the fast axis azimuth. Experiments show that for the quarter-wave plate the average and standard deviation of the retardation are 89.78°and 0.14°, respectively, and the maximum deviation of the fast axis azimuth is 0.6°; for the eighth-wave plate, the average and standard deviation of the retardation are 45.15°and 0.15°, respectively, and the maximum deviation of the fast axis azimuth is 0.53.

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“…In solid crystals, the molecules or atoms are usually not chiral and so the circular birefringence is associated with the absence of a center of symmetry. 24 Hence, in this work the circular birefringence has been neglected and only linear birefringence is considered. Since even at stress conditions only noncentrosymmetric crystals are candidates for exhibiting optical activity, 23 the diamond is not expected to be optically active even at high pressures.…”

Section: Introductionmentioning

confidence: 99%

High pressure ellipsometry: A novel method for measuring the optical properties and electronic structure of materials in diamond anvil cells

Nissim

Eliezer²,

Bakshi³

et al. 2011

Review of Scientific Instruments

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High pressure ellipsometry (HPE) method was developed for determining the index of refraction of opaque materials in a diamond anvil cell (DAC). A main difficulty in DAC-based HPE, namely, the pressure-induced birefringence developed in the diamond, was overcome enabling the extraction of the ellipsometric parameters of the sample. The method used was based on the fact that an unpolarized light is unaffected by a retarding optical element and thus reduces the number of unknown parameters in the problem. Because of technical difficulties in using unpolarized light, a linear combination of orthogonal polarizations was applied. In the experimental procedure, multiangle measurements of the ellipsometric parameter ψ are collected at each pressure and the data is fitted together with a measurement of the near normal reflectivity, in order to extract the complex index of refraction. As a test case, this procedure was used to measure the high pressure index of refraction of iron up to 30 GPa for light with wavelengths of 532 and 633 nm. From the index of refraction as a function of pressure the diamond-iron interface emissivity for different pressures was derived and from which the phase transition α → ε could be identified and characterized. The emissivity increases with pressure both at the α (0-9 GPa) and the ε phase (21-30 GPa) however decreases at the mixed α - ε (9-21 GPa) range. From the imaginary part of the index of refraction the pressure dependence of the energy skin depth of iron was extracted. It was found that the energy skin depth increases by an order of magnitude at 30 GPa relative to ambient conditions.

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Three-intensity measurement technique and its measurement in elliptical retarder

Cited by 9 publications

References 6 publications

A Simple Graphic Method for Analyzing the Polarization State of an Optical System With a Fixed Polarizer and a Rotating Elliptical Retarder

A Simple Graphic Method for Analyzing the Polarization State of an Optical System With a Fixed Polarizer and a Rotating Elliptical Retarder

Real-time measurement of retardation and fast axis azimuth for wave plates

High pressure ellipsometry: A novel method for measuring the optical properties and electronic structure of materials in diamond anvil cells

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