2014
DOI: 10.1093/jmicro/dfu112
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Three-dimensional volume imaging with electron microscopy toward connectome

Abstract: Ultrastructural analyses with electron microscopy have provided indispensable information to understand physiology and pathology of the nervous system. Recent advancement in imaging methodology paved the way for complete reconstruction of the neuronal connection map in the central nervous system, which is termed 'connectome' and would provide key insights to understand the functions of the brain. The critical advancement includes serial ultrastructural observation with scanning electron microscopy (SEM) instea… Show more

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Cited by 36 publications
(18 citation statements)
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“…Due to the complexity of neural connections, three-dimensional (3D) reconstruction using electron microscope images is desired. Serial section transmission electron microscopy (ssTEM) has been used for 3D reconstruction, but ssTEM is time-consuming and technically demanding [ 22 , 23 ]. To overcome the disadvantages, focused ion beam/scanning electron microscopy (FIB/SEM) has been developed to acquire serial section SEM images, which have been shown to be sufficient for the reconstruction of 3D images of the synaptic connections and structures [ 22 25 ].…”
Section: Introductionmentioning
confidence: 99%
“…Due to the complexity of neural connections, three-dimensional (3D) reconstruction using electron microscope images is desired. Serial section transmission electron microscopy (ssTEM) has been used for 3D reconstruction, but ssTEM is time-consuming and technically demanding [ 22 , 23 ]. To overcome the disadvantages, focused ion beam/scanning electron microscopy (FIB/SEM) has been developed to acquire serial section SEM images, which have been shown to be sufficient for the reconstruction of 3D images of the synaptic connections and structures [ 22 25 ].…”
Section: Introductionmentioning
confidence: 99%
“…Recent effort towards homogenous staining of bulk tissues enabled acquisition of images from the brain tissues for reconstruction of very large volume 14 15 . However, even with these approaches, imaging at higher magnifications and longer dwelling times for a better signal-to-noise ratio need higher electron doses and may be hampered by sample charging and damage, which are particularly prominent in SBF-SEM imaging 16 17 18 . It currently remains unclear whether increasing the conductivities of resins, which are typically non-conductive, reduces charging and sample damage and is beneficial for successful volume imaging with SEM.…”
mentioning
confidence: 99%
“…Bars: 50 μm (B,C) , 12.5 μm (D) , 5 μm (E) or 500 nm ( E , inset). Images were adapted from Ohno et al ( 2015 ) with permission.…”
Section: Basic Methodology Of Sample Preparations and Data Acquisitiomentioning
confidence: 99%