2022
DOI: 10.1016/j.sab.2021.106340
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Three-dimensional topographic and multi-elemental mapping by unilateral-shift-subtracting confocal controlled LIBS microscopy

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Cited by 7 publications
(4 citation statements)
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“…A LIBS system was attached by He at al. 142 to a unilateral-shift-subtracting confocal microscope , to achieve fast, high spatial resolution, multi-element maps of sample surfaces. This system, called unilateral-shift-subtracting confocal controlled LIBS microscopy (UCCLIBS), had a surface axial focusing resolution of ∼18 nm under a 20× objective lens with a numerical aperture value of 0.4.…”
Section: Laser-based Atomic Spectrometrymentioning
confidence: 99%
“…A LIBS system was attached by He at al. 142 to a unilateral-shift-subtracting confocal microscope , to achieve fast, high spatial resolution, multi-element maps of sample surfaces. This system, called unilateral-shift-subtracting confocal controlled LIBS microscopy (UCCLIBS), had a surface axial focusing resolution of ∼18 nm under a 20× objective lens with a numerical aperture value of 0.4.…”
Section: Laser-based Atomic Spectrometrymentioning
confidence: 99%
“…This method is simple without the need for an extra device for positioning, and the intensity maximum around the focal point was employed as the reference to ensure consistent detection on different samples. It has been proved that this positioning way was free of calibration for LIBS mapping on a single target [24][25][26], while the quantitative application was not reported so far. So, in this work, we applied the positioning way for the LIBS quantitation of copper alloys.…”
Section: Introductionmentioning
confidence: 99%
“…16 Some studies added auxiliary optical structures in LIBS systems to obtain the optimal focusing position, such as laser pointers, 17 and multi-elemental mapping method. 18 For acquiring stable and high-intensity spectra of non-flat samples, Lei et al proposed a single-beam-splitting method. 19,20 In their work, the laser was divided into two beams by a beam-splitter and focused on the analyzed sample surface, where the intensity of the characteristic spectral lines of Al and Cu increased by 2.5 and 3.5 times, respectively, compared to a single beam.…”
Section: Introductionmentioning
confidence: 99%