2010
DOI: 10.1002/pen.21691
|View full text |Cite
|
Sign up to set email alerts
|

Three‐dimensional scanning electron microscopy characterization of the topography of textured polymeric surfaces

Abstract: A stereographic scanning electron microscopy (SEM) technique combined with a filtering procedure was used to characterize the surface topography of injection‐molded polymeric plaques to improve the understanding of the relation between surface texture and gloss of deliberately textured and quite rough surfaces. The specimens, having small differences in surface topography and gloss, were produced by using two mold cavities with slight differences in surface texture and three different polymers. Small differenc… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2010
2010
2022
2022

Publication Types

Select...
4
1

Relationship

2
3

Authors

Journals

citations
Cited by 5 publications
(4 citation statements)
references
References 9 publications
(17 reference statements)
0
4
0
Order By: Relevance
“…Compared to the other two materials, the reflectance in the 110°‐direction was significantly higher for the PP specimens. Neither any difference in surface topography, reported in [21], nor color between the plaques can seemingly account for this enhanced reflectance. Possibly, an evaluation of the entire angular distribution of the reflected light can provide relevant information regarding the lower CGF of the PP specimens.…”
Section: Resultsmentioning
confidence: 94%
“…Compared to the other two materials, the reflectance in the 110°‐direction was significantly higher for the PP specimens. Neither any difference in surface topography, reported in [21], nor color between the plaques can seemingly account for this enhanced reflectance. Possibly, an evaluation of the entire angular distribution of the reflected light can provide relevant information regarding the lower CGF of the PP specimens.…”
Section: Resultsmentioning
confidence: 94%
“…(1)) has been calculated to characterize the surface topography in the height direction over the analyzed area: where z ( x,y ) is the surface height relative to the average surface area (profile) measured at the coordinates ( x,y ) of area A . The stereo‐technique is described in detail elsewhere 15, 16…”
Section: Methodsmentioning
confidence: 99%
“…However, for the specimens in the present study, a higher RMS‐roughness value was always associated with a higher value of the lateral correlation length, cf. Ref 11…”
Section: Methodsmentioning
confidence: 99%
“…Ref. 11. Since the measures of lateral correlation length provided no additional information, they were not included here.…”
Section: Specimen Preparationmentioning
confidence: 99%