2003
DOI: 10.1117/1.1524170
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Three-dimensional optical metrology with extended depth-measuring range using a holographic axilens

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Cited by 4 publications
(3 citation statements)
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“…DOEs are commonly designed to transform an incident light wavefront into a desired light pattern. Recently, Hasman and Kleiner developed a method for 3-D optical metrology using a Lee type binary mask (a binary DOE) which encodes an axilens 9 . Because of its circular support, a conventional axilens produces a long depth of focus with a nearly constant intensity 10 .…”
Section: Introductionmentioning
confidence: 99%
“…DOEs are commonly designed to transform an incident light wavefront into a desired light pattern. Recently, Hasman and Kleiner developed a method for 3-D optical metrology using a Lee type binary mask (a binary DOE) which encodes an axilens 9 . Because of its circular support, a conventional axilens produces a long depth of focus with a nearly constant intensity 10 .…”
Section: Introductionmentioning
confidence: 99%
“…The measurement of surface contour information is an especially difficult problem in machine vision systems since depth information is often lost or difficult to interpret. Currently many efforts are directed to development of 3D-vision systems, which use the structured light triangulation method [1,2]. However, speed of such systems is not very high and limited by the time of image acquisition and processing.…”
Section: Introductionmentioning
confidence: 99%
“…The researchers noted that further artificial expansion of the beam focal length could cause significant weakening of its axial intensity. The probe depth could be increased by 60 mm without decreasing the lateral resolution, which was 0.6 μm, by using a holographic axilens in an optical profilometer system [57].…”
mentioning
confidence: 99%