Three-dimensional numerical analysis of mixed ionic and electronic conducting cathode reconstructed by focused ion beam scanning electron microscope

Matsuzaki, Katsuhisa; Shikazono, Naoki; Kasagi, Nobuhide

doi:10.1016/j.jpowsour.2010.11.142

Cited by 134 publications

(110 citation statements)

References 20 publications

Supporting

Mentioning

100

Contrasting

Order By: Relevance

“…These geometric parameters are part of a set of four geometric parameters that are defined through normalizing the electrode geometric variable by the unit cell half-width, L UC . These four parameters are defined in Equation (15), and include the dimensionless coordinates (x * and y * ), the length fraction, and the electrode aspect ratio.…”

Section: Dimensionless Parameters and Performance Metricsmentioning

confidence: 99%

“…Two forms of the dimensionless depletion current density can be defined based on the dimensionless parameters in Equation (15). The first form, the dimensionless depletion current, compares the depletion current density to a lateral limiting current density based on the unit cell half-width, Equation (16).…”

Section: Dimensionless Parameters and Performance Metricsmentioning

confidence: 99%

See 1 more Smart Citation

An analytical approach for solid oxide cell electrode geometric design

Nelson

2015

Journal of Power Sources

View full text Add to dashboard Cite

Section: Dimensionless Parameters and Performance Metricsmentioning

confidence: 99%

Section: Dimensionless Parameters and Performance Metricsmentioning

confidence: 99%

An analytical approach for solid oxide cell electrode geometric design

Nelson

2015

Journal of Power Sources

View full text Add to dashboard Cite

“…This is nowadays routinely performed in the semiconductor industry to investigate the performance of devices [24]. In addition to traditional biological and materials sciences [25][26][27][28][29][30][31][32][33], FIB-SEM analysis of natural solid materials, e.g., geological materials, has recently become increasingly popular [34][35][36][37].…”

Section: Introductionmentioning

confidence: 99%

Nano-Tomography of Porous Geological Materials Using Focused Ion Beam-Scanning Electron Microscopy

Liu

Huis

et al. 2016

Minerals

View full text Add to dashboard Cite

Tomographic analysis using focused ion beam-scanning electron microscopy (FIB-SEM) provides three-dimensional information about solid materials with a resolution of a few nanometres and thus bridges the gap between X-ray and transmission electron microscopic tomography techniques. This contribution serves as an introduction and overview of FIB-SEM tomography applied to porous materials. Using two different porous Earth materials, a diatomite specimen, and an experimentally produced amorphous silica layer on olivine, we discuss the experimental setup of FIB-SEM tomography. We then focus on image processing procedures, including image alignment, correction, and segmentation to finally result in a three-dimensional, quantified pore network representation of the two example materials. To each image processing step we consider potential issues, such as imaging the back of pore walls, and the generation of image artefacts through the application of processing algorithms. We conclude that there is no single image processing recipe; processing steps need to be decided on a case-by-case study.

show abstract

“…Numerical simulation is an effective approach not only for calculating the overall system performance but also for analyzing microscale phenomena inside complex porous electrodes. Because the microstructure of the electrodes has a significant effect on the cell performance, researchers have been investigating the relationships between the electrode microstructure and the electrochemical performance through experimental and numerical approaches [12][13][14][15][16][17][18].…”

Section: Introductionmentioning

confidence: 99%

Chromium poisoning in (La,Sr)MnO3 cathode: Three-dimensional simulation of a solid oxide fuel cell

Miyoshi

Kishimoto

Saito

et al. 2016

Journal of Power Sources

View full text Add to dashboard Cite

A three-dimensional numerical model of a single solid oxide fuel cell (SOFC) considering chromium poisoning on the cathode side has been developed to investigate the evolution of the SOFC performance over long-term operation. The degradation model applied in the simulation describes the loss of the cathode electrochemical activity as a decrease in the active triple-phase boundary (TPB) length. The calculations are conducted for two types of cell: lanthanum strontium manganite (LSM)/yttria-stabilized zirconia (YSZ)/Ni-YSZ and LSM-YSZ/YSZ/Ni-YSZ. Their electrode microstructures are acquired by imaging with a focused ion beam scanning-electron microscope (FIB-SEM). The simulation results qualitatively reproduce the trends of chromium poisoning reported in the literature. It has been revealed that the performance degradation by chromium is primarily due to an increase in the cathode activation overpotential. In addition, in the LSM-YSZ composite cathode, TPBs in the vicinity of the cathode-electrolyte interface preferentially deteriorate, shifting the active reaction site towards the cathode surface. This also results in an increase in the cathode ohmic loss associated with oxide ion conduction through the YSZ phase. The effects of the cell temperature, the partial pressure of steam at the chromium source, the cathode microstructure, and the cathode thickness on chromium poisoning are also discussed.

show abstract

Three-dimensional numerical analysis of mixed ionic and electronic conducting cathode reconstructed by focused ion beam scanning electron microscope

Cited by 134 publications

References 20 publications

An analytical approach for solid oxide cell electrode geometric design

An analytical approach for solid oxide cell electrode geometric design

Nano-Tomography of Porous Geological Materials Using Focused Ion Beam-Scanning Electron Microscopy

Chromium poisoning in (La,Sr)MnO3 cathode: Three-dimensional simulation of a solid oxide fuel cell

Contact Info

Product

Resources

About