Three-dimensional manipulation of carbon nanotubes under a scanning electron microscope

Abstract

Carbon nanotubes are manipulated in three dimensions inside a scanning electron microscope (SEM). A custom piezoelectric vacuum manipulator achieves positional resolutions comparable to scanning probe microscopes, with the ability to manipulate objects along one rotational and three linear degrees of freedom. This prototypical device can probe, select and handle nanometre-scale objects such as carbon nanotubes in order to explore and correlate their mechanical and electrical properties. Under real-time SEM inspection, carbon nanotubes are stressed while monitoring their conductivity, and nanotubes are attached to commercial atomic force microscope (AFM) tips such that the forces applied to the tubes can be measured from the cantilevers' deflections. The manipulator functions both as a research tool for investigating properties of carbon nanotubes and other nanoscale objects without surface restrictions, and as a rudimentary building device for larger nanotube assemblies. This capability to select and manipulate nanoscale components and to examine directly their suitability as construction materials during various phases of the construction process will play an important role in enabling the technology of assembling mechanical and electronic devices from prefabricated components.

Equivalent-continuum modeling of nano-structured materials

“…Many experimental [4][5][6][7][8] and theoretical [9][10][11][12][13][14] studies have been performed on single-and multi-walled carbon nanotubes. In particular, deformation modes and nanotube stiffnesses have been closely examined.…”

Controlling the shape, orientation, and linkage of carbon nanotube features with nano affinity templates

“…Depending on the intended application, one wants to be able to pattern SWNTs as individual tubes (3,4), small bundles (5), or thin films (6,8,9). Previous studies have shown that individual carbon nanotubes can be positioned (10), bent (11), and even welded (12) with nanometer accuracy by using scanning probe instruments. This level of manipulation is limited to serial and therefore slow processes that span relatively short distances (100 m).…”

Packaging of an Iron-Gallium Nanowire Acoustic Sensor

“…The SEM captured images of the wires in different resonant modes, and the frequencies were used to calculate the bending modulus of the nanowires which was found to be about 47 GPa instead of 72 GPa which is the accepted value for bulk fused silica fibers. Yu et al have designed an implemented a nanomanipulator system that fits inside an SEM [6,7]. Much like the work of Dikin et al, the nanomanipulator setup was used to excite nanowires at resonant frequencies [6].…”

“…Much like the work of Dikin et al, the nanomanipulator setup was used to excite nanowires at resonant frequencies [6]. The setup has also been used for examining carbon nanotubes [7]. Under the inspection of an SEM, the nanotubes were picked up and fixed to AFM cantilevers where they could be manipulated and bent while measuring properties such as stiffness and conductivity.…”

“…Under the inspection of an SEM, the nanotubes were picked up and fixed to AFM cantilevers where they could be manipulated and bent while measuring properties such as stiffness and conductivity. [7].…”