2023
DOI: 10.1063/5.0169526
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Three-dimensional distribution and propagation of dislocations in β-Ga2O3 revealed by Borrmann effect x-ray topography

Yongzhao Yao,
Yoshiyuki Tsusaka,
Keiichi Hirano
et al.

Abstract: Synchrotron radiation x-ray topography (XRT) in a transmission configuration based on the Borrmann effect (BE) was carried out to observe characteristic dislocation structures and three-dimensional distribution and propagation of dislocations in β-Ga2O3 grown via the edge-defined film-fed growth (EFG) method. Substrates with a range of surface orientations of (001), (010), and (2¯01), cut perpendicular or parallel to the ⟨010⟩ growth direction of the EFG, were observed to understand the whole picture of disloc… Show more

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