Three-Dimensional Continuous Displacement Measurement with Temporal Speckle Pattern Interferometry

Qin, Jie; Gao, Zhan; Wang, Xu; Yang, Shanwei

doi:10.3390/s16122020

Cited by 25 publications

(7 citation statements)

References 18 publications

(16 reference statements)

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“…8). The ratios of the experimental and calculated program frequencies are relatively equal (Table 5), therefore, the difference between them is caused by the difference in geometry between the analytical and real circular blades (Joenathan et al 1995), (Qin et al 2016) and the incorrectly selected material property for program calculation.…”

Section: Resultsmentioning

confidence: 99%

An Experimental Study of the Vibrational Characteristics of a Diamond Circular Blade Using Electronic Speckle-Pattern Interferometry and FEM

Tkach

Halynkin

Proskurin

et al. 2021

Acta Mechanica Et Automatica

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The compact installation and technology for determining vibration characteristics by the ESPI method has been created. The experimental determination of the dynamic characteristics of a diamond circular blade with a diameter of 203.4 mm and a thickness of 1.19 mm using real-time electronic speckle interferometry is presented. 15 mode shapes of vibration were detected in the range from 100 to 5000 Hz. The program calculation of the natural frequencies and mode shapes is carried out for three values of the clamping inner diameter (42 mm, 44 mm, 46 mm). The options for calculating a disk with a rim and without a rim are considered. It is shown that the minimum mean squared error of the calculation is achieved for the values of the diameter of the disk 46 mm, 42 mm and 44 mm for the number of nodal circles 0, 1 and 2, respectively. To verify the accuracy of the interferometer, experimental, computational and analytical studies of console steel rod 200 × 22.25 × 3.78 mm in size were carried out.

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Section: Resultsmentioning

confidence: 99%

An Experimental Study of the Vibrational Characteristics of a Diamond Circular Blade Using Electronic Speckle-Pattern Interferometry and FEM

Tkach

Halynkin

Proskurin

et al. 2021

Acta Mechanica Et Automatica

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“…There are many displacement-based damage identification methods [18][19][20], but none of them can explain the physical connection between the position of damage and the displacement. Generally, considering a structure with n degrees of freedom, the displacement under the action of static loads should satisfy the following equation:…”

Section: Basic Principle Of Structural Damage Localization Based On Dmentioning

confidence: 99%

Model-Free Method for Damage Localization of Grid Structure

Yang

Wang

et al. 2019

Applied Sciences

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A model-free damage identification method for grid structures based on displacement difference is proposed. The inherent relationship between the displacement difference and the position of structural damage was deduced in detail by the Sherman–Morrison–Woodbury formula, and the basic principle of damage localization of the grid structure was obtained. That is, except for the tensile and compressive deformations of the damaged elements, the deformations of other elements were small, and only rigid body displacements occurred before and after the structural damage. According to this rule, a method for identifying the position of the damage was proposed for the space grid structure by using the rate of change of length for each element. Taking a space grid structure with a large number of elements as an example, the elastic modulus reduction method was used to simulate the damage to the elements, and the static and dynamic test parameters were simulated respectively to obtain the difference in displacement before and after the structural damage. The rate of change of length of each element was calculated based on the obtained displacement difference, and data noise was added to the simulation. The results indicated that the element with the larger length change rate in the structure was the most likely to be damaged, and the damaged element can be accurately evaluated even in the presence of noise in data.

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“…It can be divided into temporal and spatial carrier phase-shifting techniques. The temporal phase-shifting technique evaluates the phase from multiple shearograms captured sequentially [12,13], offering the advantages of precise measurement and ease of phase calculation, but requiring the measured objects to remain stationary during the measurement process. Therefore, the temporal phase-shifting method performs well for static or quasi-static measurements.…”

Section: Introductionmentioning

confidence: 99%

Pixelated Carrier Phase-Shifting Shearography Using Spatiotemporal Low-Pass Filtering Algorithm

Yan

Liu

et al. 2019

Sensors

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Shearography has been widely used in non-destructive testing due to its advantages in providing full-field, high precision, real-time measurement. The study presents a pixelated carrier phase-shifting shearography using a pixelated micropolarizer array. Based on the shearography, a series of shearograms are captured and phase maps corresponding to deformation are measured dynamically and continuously. Using the proposed spatiotemporal filtering algorithm in the complex domain, the set of phase maps are simultaneously low-pass filtered in the spatial and temporal domains, resulting in better phase quality than spatial low-pass filtering. By accumulating the temporally adjacent phase, the phase corresponding to large deformation can be evaluated; thus, large deformations can be accurately measured and protected from speckle noise, allowing internal defects to be easily identified. The capability of the proposed shearography is described by theoretical discussions and experiments.

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Three-Dimensional Continuous Displacement Measurement with Temporal Speckle Pattern Interferometry

Cited by 25 publications

References 18 publications

An Experimental Study of the Vibrational Characteristics of a Diamond Circular Blade Using Electronic Speckle-Pattern Interferometry and FEM

An Experimental Study of the Vibrational Characteristics of a Diamond Circular Blade Using Electronic Speckle-Pattern Interferometry and FEM

Model-Free Method for Damage Localization of Grid Structure

Pixelated Carrier Phase-Shifting Shearography Using Spatiotemporal Low-Pass Filtering Algorithm

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