2018
DOI: 10.1115/1.4041532
|View full text |Cite
|
Sign up to set email alerts
|

Three-Dimensional Compatible Sacrificial Nanoimprint Lithography for Tuning the Wettability of Thermoplastic Materials

Abstract: We report the tuning of surface wetting through sacrificial nanoimprint lithography (SNIL). In this process, grown ZnO nanomaterials are transferred by imprint into a metallic glass (MG) and an elastomeric material, and then etched to impart controlled surface roughness. This process increases the hydrophilicity and hydrophobicity of both surfaces, the Pt57.5Cu14.7Ni5.3P22.5 MG and thermoplastic elastomer (TPE), respectively. The growth conditions of the ZnO change the characteristic length scale of the roughn… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 73 publications
0
1
0
Order By: Relevance
“…These techniques have their own advantages and disadvantages such as high efficiency, resolution limit, complex steps, costly equipment, and material dependence [5][6][7][8]. Focused ion beam (FIB) milling combined with electron column (dualbeam system) a powerful technique for fabricating microand nano-structures (ranging from sub-50 nm to several tens of microns in size) with a high patterning flexibility on almost any material [9][10][11][12]. The technique has the distinctive advantage of direct writing with the ability to control pixel by the ion dose (dwell time), hence permitting to produce 3D patterns with relatively high aspect ratio and without the use of additional masks and resists [13,14].…”
Section: Introductionmentioning
confidence: 99%
“…These techniques have their own advantages and disadvantages such as high efficiency, resolution limit, complex steps, costly equipment, and material dependence [5][6][7][8]. Focused ion beam (FIB) milling combined with electron column (dualbeam system) a powerful technique for fabricating microand nano-structures (ranging from sub-50 nm to several tens of microns in size) with a high patterning flexibility on almost any material [9][10][11][12]. The technique has the distinctive advantage of direct writing with the ability to control pixel by the ion dose (dwell time), hence permitting to produce 3D patterns with relatively high aspect ratio and without the use of additional masks and resists [13,14].…”
Section: Introductionmentioning
confidence: 99%