Atomic force microscopy (AFM)—frequently also denoted as scanning force microscopy (SFM)—has developed into a workhorse for nano‐ and microtechnology. This technique is an offspring of
scanning tunneling microscopy
(STM) and was also invented by Binnig et al[Binnig, G., Rohrer, H., Gerber, C., and Weibel, E. 1982. Surface studies by scanning tunneling microscopy.
Phys. Rev. Lett.
49(1):57–61; Binnig, G., Quate, C. F., and Gerber, C. 1986. Atomic force microscope.
Phys. Rev. Lett.
56(9):930]. Nowadays, it is used not only in physical, chemical, biological, and medical research laboratories, but also in many companies for everyday tasks like quality control. The success of the AFM is due to its high‐resolution imaging capabilities in combination with its versatility, making it possible to image surfaces down to the atomic scale. Due to its universality, AFM can be applied to a large variety of samples, and it can be adapted to many different environments (gaseous, liquid, or vacuum). The atomic force microscope can be operated in different modes, which can be categorized into
static
and
dynamic
‐modes. We give an introduction to the basic concepts of these two modes and present applications under different environmental conditions.