2003
DOI: 10.1016/s0304-8853(02)01280-5
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Thin single layer materials for device application

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Cited by 11 publications
(4 citation statements)
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“…As is well known the effect of substrate roughness affects the quality of a device [28]. Measurements of the surface showed that the paper had a roughness of 15-20 nm in comparison to that found on silicon of 1-2 nm or glass of 5 nm.…”
Section: Resultsmentioning
confidence: 93%
“…As is well known the effect of substrate roughness affects the quality of a device [28]. Measurements of the surface showed that the paper had a roughness of 15-20 nm in comparison to that found on silicon of 1-2 nm or glass of 5 nm.…”
Section: Resultsmentioning
confidence: 93%
“…Figure 3b shows a series of time-resolved XMCD-PEEM images of a chain from the optimal region taken at delay times between 1 and 4 ns. Surface roughness and other lithographical irregularities may contribute to errors in this system 8,30,31,32 while random signal propagation errors from individual clocking cycles are averaged into each image. This leads to contrast "graying" from individual nanomagnets that do not reproducibly reorient in the same direction each cycle.…”
Section: Main Textmentioning
confidence: 99%
“…The electron current was optimized by biasing the electron filament's housing and the filament to give a maximum electron current of 25 mA at the centre of the ionization chamber, through which the atom flux of the material to be ionized was greatest (in this case either aluminium or permalloy). An atom flux was produced by either resistance heating of an appropriate crucible [12] or hotcathode evaporation from a filament. Thickness calibration of an evaporated sample showed that the atom flux was greater than 10 12 atoms s −1 and it was found that some of the atoms were ionized by electron ionization, producing an ion current at the ion detection plate.…”
Section: Electron Ionizationmentioning
confidence: 99%