2012
DOI: 10.1088/1367-2630/14/10/103037
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Thin NaCl films on silver (001): island growth and work function

Abstract: The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy. In the sub-monolayer range, the NaCl film is composed of large crystalline islands, which decrease in density and increase in size with increasing temperature during deposition. Each island is composed of a large base island 2 monolayers (ML) thick (for T > 343 K), which collects impinging NaCl molecules that form … Show more

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Cited by 33 publications
(37 citation statements)
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“…The island edges exhibit various orientations with respect to the substrate axes, in agreement with previously reported azimuthal mosaicity [39,41,42]. After longer deposition times (30 min instead of 10 min) at the same cell temperature, NaCl films reveal similar features with larger side lengths, in the 200-500 nm range (data not shown here).…”
Section: A Nacl Film Geometry Before Dissociationsupporting
confidence: 91%
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“…The island edges exhibit various orientations with respect to the substrate axes, in agreement with previously reported azimuthal mosaicity [39,41,42]. After longer deposition times (30 min instead of 10 min) at the same cell temperature, NaCl films reveal similar features with larger side lengths, in the 200-500 nm range (data not shown here).…”
Section: A Nacl Film Geometry Before Dissociationsupporting
confidence: 91%
“…[40]) and comparison with previous STM [38] and noncontact atomic force microscopy [39] studies. Cabailh et al [39] observed that NaCl films grown on Ag(001) at substrate temperatures in the 343-443 K range essentially consist of 2 ML-thick islands. At low bias voltage (U b = 1 V), in the area shown in Fig.…”
Section: A Nacl Film Geometry Before Dissociationmentioning
confidence: 84%
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“…If in the course of such experiments the bias voltage is varied as an additional parameter, very important electronic properties of the silicene films could be extracted as well, as it has been exemplified on the Si(111)(7 × 7) surface32. Such experiments could be further assisted by Kelvin probe microscopy33, which has shown to be quite powerful for measuring, e.g., work function differences at the nanometer34 and even atomic scale35. Most importantly, since STM as well as nc-AFM nowadays allow manipulating atoms36, molecules37 and clusters38, the two types of microscopes could be used, in principle, to manipulate the second layer silicene islands on the first one, provided that the coupling between the layers is only weak.…”
Section: Discussionmentioning
confidence: 99%