2006
DOI: 10.1016/j.tsf.2005.12.172
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Thin manganite films for fast fault current limiter applications

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Cited by 7 publications
(4 citation statements)
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“…At low electric field strengths E < E th = V th /l, the ER effect is very small and can be neglected. The values of E th and ER depend on the chemical composition, temperature, and morphology of the film [4]. Analysis of the ρ-versus-E dependence by fitting normalized conductance G/G 0 to the phenomenological relation G/G 0 = 1 + G α · V α , where G 0 is the conductance at low voltages and G α and α are the parameters related to a transport mechanism, showed that α falls in the range between 1.3 and 2.5, which was predicted for multistep tunneling through two or three states in grain boundaries, respectively [7].…”
Section: Resultsmentioning
confidence: 99%
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“…At low electric field strengths E < E th = V th /l, the ER effect is very small and can be neglected. The values of E th and ER depend on the chemical composition, temperature, and morphology of the film [4]. Analysis of the ρ-versus-E dependence by fitting normalized conductance G/G 0 to the phenomenological relation G/G 0 = 1 + G α · V α , where G 0 is the conductance at low voltages and G α and α are the parameters related to a transport mechanism, showed that α falls in the range between 1.3 and 2.5, which was predicted for multistep tunneling through two or three states in grain boundaries, respectively [7].…”
Section: Resultsmentioning
confidence: 99%
“…In recent years, significant progress in microwave cryogenic electronics operating at liquid nitrogen temperatures has been achieved. Symmetrical thin-film limiters using current-induced phase transitions from superconducting to normal state [3] tance" (ER) effect [4] were proposed to be capable of protecting electronic front ends from EMP. These materials could ensure subnanosecond response of limiters and withstand short EMP action.…”
Section: Introductionmentioning
confidence: 99%
“…The "front-door" and the "indoor" can be either passive or active electronic units. For example, various voltage and current limiters, based on non-crystalline semiconductors [11], superconductors [12] and magnetic materials [13][14][15] are used as the "front--door" protectors. The best protection effect is achieved when all these measures are applied simultaneously.…”
Section: Introductionmentioning
confidence: 99%
“…As a result, the irreversible damaging of the device occurs mainly at the electrode regions. This phenomenon is very important for designing protectors against short electromagnetic pulse (SEMP) [2], because it increases the attenuation in protecting regime, but at the same time it also limits the highest possible power of device operation. In order to reveal the nature and behavior of the switching we investigated high current regime in epitaxial films having the same chemical composition as polycrystalline films used for protectors against SEMP.…”
Section: Introductionmentioning
confidence: 99%