1996
DOI: 10.1143/jjap.35.l1260
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Thin Film Fabrication of Bi2(Sr, Ca)2CuOx Phase at Temperatures between 450 and 650°C by Plasma-Assisted Ion Beam Sputtering

Abstract: EXAFS measurements have been made through the melting point up to 291 "C using a Lytle type cell with a 25 pm thick tin sample. The best agreement with the liquid state results is found with a model that retains the 4-2 coordination of the white tin structure.

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Cited by 8 publications
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