1999
DOI: 10.1039/a902957e
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Thin film deposition of lanthanum manganite perovskite by the ALE process

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Cited by 40 publications
(16 citation statements)
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References 30 publications
(5 reference statements)
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“…25 We are hereby able to deposit films with a composition close to LaMnO 3 with a La(thd) 3 : Mn(thd) 3 pulse ratio of 1 : 1 at much lower temperatures than previously reported. 24 At the same time, there are presently no problems with depletion of manganese upon introduction of lanthanum as reported in ref. 24.…”
Section: Resultsmentioning
confidence: 72%
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“…25 We are hereby able to deposit films with a composition close to LaMnO 3 with a La(thd) 3 : Mn(thd) 3 pulse ratio of 1 : 1 at much lower temperatures than previously reported. 24 At the same time, there are presently no problems with depletion of manganese upon introduction of lanthanum as reported in ref. 24.…”
Section: Resultsmentioning
confidence: 72%
“…24 At the same time, there are presently no problems with depletion of manganese upon introduction of lanthanum as reported in ref. 24.…”
Section: Resultsmentioning
confidence: 72%
See 2 more Smart Citations
“…ALD of the LaMnO 3 was first reported by Nilsen et al in 1999, using β‐diketonates and ozone . This was in the early years of complex oxide ALD, and little work was done to control crystallization or to measure functional properties of the resulting films.…”
Section: The Current Toolboxmentioning
confidence: 99%