1993
DOI: 10.1016/0040-6090(93)90084-3
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Thin epitaxial films of wide gap II–VI compounds studied by spectroscopic ellipsometry

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Cited by 23 publications
(10 citation statements)
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“…On the other hand, the shoulder present in the transmission spectra of the film prepared at 200 • C is due to presence of cubic and hexagonal phase mixture [34,35]. Therefore, the optical gap broadening with substrate temperature agrees well with XRD analysis results and supports the phase transition of films from cubic to hexagonal with increasing the substrate temperature passing by the mixture phase at 200 • C. As can be seen in Fig.…”
Section: Optical Propertiessupporting
confidence: 89%
“…On the other hand, the shoulder present in the transmission spectra of the film prepared at 200 • C is due to presence of cubic and hexagonal phase mixture [34,35]. Therefore, the optical gap broadening with substrate temperature agrees well with XRD analysis results and supports the phase transition of films from cubic to hexagonal with increasing the substrate temperature passing by the mixture phase at 200 • C. As can be seen in Fig.…”
Section: Optical Propertiessupporting
confidence: 89%
“…In other cases, homonyms (different authors with the same name and same initials), name changes due to marriage, transliteration from other alphabets, non‐standard characters (e.g., umlaute) or prefixes (von, de) usually corrupt the data integrity. Even in Zahn's case I found contortions like “Zhan” and distortions like “Zahnd” where the latter could be traced to a superscript denoting a footnote for the affiliation. Fortunately, Zahn has provided the ORCID identifier for his publications, so that also these erroneous entries are associated with his correct name.…”
Section: Number Of Publicationsmentioning
confidence: 94%
“…Обе кристаллические фазы обладают запрещенной энергетической зоной примерно одинаковой ширины. По данным разных авторов, эта ширина лежит в пределах 2.26−2.58 эВ для вюрцита [5][6][7][8][9] и 2.37−2.42 эВ для сфалерита [10][11][12][13][14][15]. Разбросы величин объясняются, по-видимому, как различием методик исследования, так и способом получения и чистотой материала.…”
Section: Introductionunclassified