“…This behavior can be attributed to a growthinduced modification of the microstructure of the amorphous films, which affects the short-range order [25]. As a result, a more collinear alignment of the distributed magnetic moments of Dy along the out-of-plane direction with film thickness is obtained [39]. It is worth noting that all CTF samples show a positive value of K eff and K eff ×t, i.e.…”
Section: Effective Magnetic Anisotropy For Had and Ctfmentioning
confidence: 93%
“…The antidot samples display noticeable changes in the effective magnetic anisotropy. Firstly, K eff values sharply decrease for the HAD in comparison to the CTF due to the competition between the intrinsic anisotropy and the shape anisotropy of nanoholes and the contribution of the out-ofplane magnetic component to the magnetization reversal process [35][36][37][38][39][40]. Therefore, it can be observed a magnetic anisotropy crossover from the in-plane to out-of-plane directions for antidot samples with layer thickness of 30 nm and 35 nm (negative values of K eff and K eff ×t).…”
Section: Effective Magnetic Anisotropy For Had and Ctfmentioning
confidence: 99%
“…film thickness, H C ×t, increase from 0.75 kOe nm up to 22 kOe nm for samples with layer thickness of 15 nm and 60 nm, respectively. Actually, the parameter H C ×t is related to the local domain wall pinning force within the alloy and this observed change with film thickness may well indicate the onset of associated changes in the film morphology[39].3.2. Antidot arrays thin films 3.2.1.…”
Influence of nanoholes array geometrical parameters 2 | 30 of high interest for the development of novel magnetic sensors and for thermo-magnetic recording patterned media based on template-assisted deposition techniques.
“…This behavior can be attributed to a growthinduced modification of the microstructure of the amorphous films, which affects the short-range order [25]. As a result, a more collinear alignment of the distributed magnetic moments of Dy along the out-of-plane direction with film thickness is obtained [39]. It is worth noting that all CTF samples show a positive value of K eff and K eff ×t, i.e.…”
Section: Effective Magnetic Anisotropy For Had and Ctfmentioning
confidence: 93%
“…The antidot samples display noticeable changes in the effective magnetic anisotropy. Firstly, K eff values sharply decrease for the HAD in comparison to the CTF due to the competition between the intrinsic anisotropy and the shape anisotropy of nanoholes and the contribution of the out-ofplane magnetic component to the magnetization reversal process [35][36][37][38][39][40]. Therefore, it can be observed a magnetic anisotropy crossover from the in-plane to out-of-plane directions for antidot samples with layer thickness of 30 nm and 35 nm (negative values of K eff and K eff ×t).…”
Section: Effective Magnetic Anisotropy For Had and Ctfmentioning
confidence: 99%
“…film thickness, H C ×t, increase from 0.75 kOe nm up to 22 kOe nm for samples with layer thickness of 15 nm and 60 nm, respectively. Actually, the parameter H C ×t is related to the local domain wall pinning force within the alloy and this observed change with film thickness may well indicate the onset of associated changes in the film morphology[39].3.2. Antidot arrays thin films 3.2.1.…”
Influence of nanoholes array geometrical parameters 2 | 30 of high interest for the development of novel magnetic sensors and for thermo-magnetic recording patterned media based on template-assisted deposition techniques.
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