2013
DOI: 10.1063/1.4823536
|View full text |Cite
|
Sign up to set email alerts
|

Thickness scaling of ferroelastic domains in PbTiO3 films on DyScO3

Abstract: We report on the thickness dependence of the ferroelastic domains of PbTiO 3 films grown on (110)-DyScO 3 with low thicknesses (up to 240 nm), which fall outside the validity range of the square root law proposed by Roytburd. For slow-grown films, the data reveal the linear thickness dependence predicted by Pertsev and Zembilgotov, using a complete elastic description, while a 2/3 scaling exponent is found for fast-grown films. Extremely long domains running all through the samples have been observed in the la… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

4
53
0
1

Year Published

2014
2014
2024
2024

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 53 publications
(60 citation statements)
references
References 36 publications
(38 reference statements)
4
53
0
1
Order By: Relevance
“…1a) 35 . X-ray diffraction (XRD) reciprocal space mapping (RSM) shows the presence of a and c domains, as well as additional intensity oscillations in the diffuse scattering because of their periodic arrangement [33][34][35] . In Pb x Sr 1 À x TiO 3 films, by substituting Pb by Sr (decreasing x), the tensile strain can be continuously increased.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…1a) 35 . X-ray diffraction (XRD) reciprocal space mapping (RSM) shows the presence of a and c domains, as well as additional intensity oscillations in the diffuse scattering because of their periodic arrangement [33][34][35] . In Pb x Sr 1 À x TiO 3 films, by substituting Pb by Sr (decreasing x), the tensile strain can be continuously increased.…”
Section: Resultsmentioning
confidence: 99%
“…GmbH) by pulsed laser deposition using a pulsed KrF excimer laser (l ¼ 248 nm), from Pb x Sr 1 À x TiO 3 targets with 4 atomic % excess lead. The substrates were treated to get a single ScO 2 termination 33,46 , allowing the growth of high-quality SrRuO 3 bottom electrodes. The growth was followed in situ by reflection highenergy electron diffraction and the films thickness was determined from the reflection high-energy electron diffraction intensity oscillations, together with X-ray reflectivity.…”
Section: Resultsmentioning
confidence: 99%
“…[19] Even if a-domains are wanted, the controlled formation of these domains and of their associated 90° a/c domain walls in thin films requires post growth annealing [20] or substrate termination control. [21] Hence, for devices based on domain-wall motion in tetragonal ferroelectrics, understanding and controlling the distribution and morphologies of a-and c-domains is essential. [14] First and foremost, this requires their observation.…”
mentioning
confidence: 99%
“…We use the impositions because of ferroelasticity and ferroelectricity to control ferroelectric/ferroelastic domain patterns. The existence of an a/c domain structure was observed before in PbTiO 3 on DyScO 3 substrates 16 , and the domain width of an anisotropic a/c domain pattern was compared with existing theory 17 . However, no direct evidence for the origin of the anisotropy was given, which would allow controlling the final pattern.…”
mentioning
confidence: 99%