“…Transmission spectra of silica obtained at much better quality can be found elsewhere. 31,51,[67][68][69] Absorbance in the 1300-1000 cm À1 range of silica is the subject of extensive investigation. In transmission spectra of thin SiO 2 films obtained at normal incidence of the IR beam, a clear shoulder is observed at ;1150 cm À1 .…”
Section: Resultsmentioning
confidence: 99%
“…39 In reflection spectra, the m AS peak shows up at ;1120 cm À1 . 45,51,[67][68][69] The behavior of the 1150 cm À1 peak observed in ATR spectra clearly indicates that this mode is located at the sample surface; therefore, it cannot be assigned to the bulk TO or LO modes. It is known that the absorptivity of the m AS fundamental (observed in transmission spectra at approximately 1100 cm À1 ) is very high: e k ; 1.5 lm À1 .…”
Section: Resultsmentioning
confidence: 99%
“…It is known that the absorptivity of the m AS fundamental (observed in transmission spectra at approximately 1100 cm À1 ) is very high: e k ; 1.5 lm À1 . 31,51,[67][68][69] It follows from the Kramers-Kronig relation that the refractive index of silica and its dielectric constant e 2 decrease at frequencies above 1100 cm À1 . At negative dielectric constants, the material behaves similarly to a metal, so that specific surface modes, called surface polaritons or surface plasmons, can develop.…”
Micro attenuated total reflection (micro-ATR) spectra of bulk silica glass were investigated for a variety of samples, including fused quartz slides, an optical fiber preform, and a series of optical fiber claddings. The experiments were performed at varied distances between the internal reflection element (IRE) and the sample. At certain conditions, a surface polariton peak is observed in the region 1100-1160 cm(-1). The position of this peak is affected by the type of IRE (Ge, Si, ZnSe, or diamond), IRE-sample distance, and the material used as an interlayer between the IRE and the sample (air or Nujol). From the experimental data, the dielectric constant of silica is determined in the region between 1100 and 1160 cm(-1). The polariton peak is also observed when glass is coated with a thin (40 nm) layer of carbon. It has also been found that the polariton peak position is affected by the thermal history of the glass, and an attempt is made to correlate the observed changes with the glass fictive temperature.
“…Transmission spectra of silica obtained at much better quality can be found elsewhere. 31,51,[67][68][69] Absorbance in the 1300-1000 cm À1 range of silica is the subject of extensive investigation. In transmission spectra of thin SiO 2 films obtained at normal incidence of the IR beam, a clear shoulder is observed at ;1150 cm À1 .…”
Section: Resultsmentioning
confidence: 99%
“…39 In reflection spectra, the m AS peak shows up at ;1120 cm À1 . 45,51,[67][68][69] The behavior of the 1150 cm À1 peak observed in ATR spectra clearly indicates that this mode is located at the sample surface; therefore, it cannot be assigned to the bulk TO or LO modes. It is known that the absorptivity of the m AS fundamental (observed in transmission spectra at approximately 1100 cm À1 ) is very high: e k ; 1.5 lm À1 .…”
Section: Resultsmentioning
confidence: 99%
“…It is known that the absorptivity of the m AS fundamental (observed in transmission spectra at approximately 1100 cm À1 ) is very high: e k ; 1.5 lm À1 . 31,51,[67][68][69] It follows from the Kramers-Kronig relation that the refractive index of silica and its dielectric constant e 2 decrease at frequencies above 1100 cm À1 . At negative dielectric constants, the material behaves similarly to a metal, so that specific surface modes, called surface polaritons or surface plasmons, can develop.…”
Micro attenuated total reflection (micro-ATR) spectra of bulk silica glass were investigated for a variety of samples, including fused quartz slides, an optical fiber preform, and a series of optical fiber claddings. The experiments were performed at varied distances between the internal reflection element (IRE) and the sample. At certain conditions, a surface polariton peak is observed in the region 1100-1160 cm(-1). The position of this peak is affected by the type of IRE (Ge, Si, ZnSe, or diamond), IRE-sample distance, and the material used as an interlayer between the IRE and the sample (air or Nujol). From the experimental data, the dielectric constant of silica is determined in the region between 1100 and 1160 cm(-1). The polariton peak is also observed when glass is coated with a thin (40 nm) layer of carbon. It has also been found that the polariton peak position is affected by the thermal history of the glass, and an attempt is made to correlate the observed changes with the glass fictive temperature.
“…The integrated area of the peak at 1036 cm -1 (Si−O stretching) , increases linearly with the number of coats, corroborating the conclusions made on the basis of ellipsometry. This linear relationship has previously been used to measure thickness of SiO 2 films on silicon. , 7 IR spectra of 1, 5, and 10 coats of 1Mg:Si sol 1 on a silicon wafer before heating.…”
An H 2 O 2 -assisted, sol-gel synthesis route to precursors to magnesium silicate thin films is described. Films having ratios of Mg to Si from 1 to 3 were prepared by spin-coating. On substrates such as silicon, aluminum, steel, glass, and fused silica, repeated coatings were applied, without intermittent treatment, to give ∼0.5 µm thick films. Crack-free consolidation was achieved by conventional or microwave heating. Densification of the films on silicon was studied by IR spectroscopy, ellipsometry, and microhardness measurements; IR analysis indicated that these films were amorphous to at least 750 °C. At high enough temperatures, durable films were obtained that exhibited antireflective properties.
“…It is recommended that anyone who uses the table carefully examine the material and references cited in the above-named references as well as other references [18][19][20][21][22][23][24][25] listed. …”
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