1968
DOI: 10.1063/1.1655992
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Thickness Estimation of Carbon Films by Electron Microscopy of Transverse Sections and Optical Density Measurements

Abstract: A rapid and convenient method is described for the accurate determination of the thickness of carbon films from their optical density. A linear relationship was found between optical density and film thickness. The optical-density-thickness curve was calibrated by direct measurement of the thickness of transverse sections of carbon films embedded in epoxy resin. The method can probably be extended to thin films of soft metals and other inorganic films having significant optical density and capable of being sec… Show more

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Cited by 28 publications
(6 citation statements)
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“…We measure the thickness by TEM observation of the curled edge of a broken film, and also by optical densitometry of the carbon film evaporated on a glass slide (Moretz et al, 1968). The two methods agree well.…”
Section: Methodsmentioning
confidence: 99%
“…We measure the thickness by TEM observation of the curled edge of a broken film, and also by optical densitometry of the carbon film evaporated on a glass slide (Moretz et al, 1968). The two methods agree well.…”
Section: Methodsmentioning
confidence: 99%
“…The film thickness measurements were obtained from the optical density technique of Moretz, Johnson & Parsons (1968), developed for this purpose. Holes were drilled in the carbon films by means of a laser-microscope, made available to this laboratory by the American Optical Company.…”
Section: A T E R I a L S A N D M E T H O D Smentioning
confidence: 99%
“…The washed PSL samples were dried on to conventional formvar-carbon films (of total mass thickness approximately 2.4 pg cm-2) made from a 0.5% solution of formvar followed by a carbon layer for stability. The carbon film thickness was measured by a new densitometry technique (Moretz et al, 1968). Mass thickness calculations were based on a mass density of 1.057 g cm-3 for PSL (Pugh & Heller, 1957) and 1.98 f 0.03 g cm-3 for the evaporated carbon.…”
Section: Materials a N D M E T H O D Smentioning
confidence: 99%
“…layers of carbon of various thickness. The thickness of these carbon layers was accurately determined according to the techniques of Moretz et al (1968). Fortuitously the density of evaporated carbon (Reed 1975) is the same as that of keratin (1.30 g em") and so we had the means of effectively determining the penetration depth for sulphur analyses of the hair surface in terms of that carbon thickness on the sulphur-containing protein substrate which at a given incident electron energy would eliminate the emission of the sulphur Ka x-rays.…”
Section: Depth Of Electron-induced X-ray Emissionmentioning
confidence: 99%