Abstract:The dielectric screening plays a
critical role in determining the
fundamental electronic properties in semiconductor devices. In this
work, we report a noncontact and spatially resolved method, based
on Kelvin probe force microscopy (KPFM), to obtain the inherent dielectric
screening of black phosphorus (BP) and violet phosphorus (VP) as a
function of the thickness. Interestingly, the dielectric constant
of VP and BP flakes increases monotonically and then saturates to
the bulk value, which is consistent with … Show more
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