Thickness dependence of rotatable anisotropy in exchange-biased NiFe/FeMn bilayers

Kim, J. K.; Kim, S.W.; Kim, B.K.; Lee, S.S.; Hwang, Dosam

doi:10.1109/intmag.2003.1230886

Digest of INTERMAG 2003. International Magnetics Conference (Cat. No.03CH37401)

DOI: 10.1109/intmag.2003.1230886

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Thickness dependence of rotatable anisotropy in exchange-biased NiFe/FeMn bilayers

J. K. Kim

S.W. Kim

B.K. Kim

et al.

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Thickness dependence of rotatable anisotropy in exchange-biased NiFe/FeMn bilayers

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