1988
DOI: 10.1051/jphyscol:19888776
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THICKNESS DEPENDENCE OF MAGNETIZATION AND MAGNETOSTRICTION OF NiFe AND NiFeRh FILMS

Abstract: The saturation magnetization, 4πMs, and the magnetostriction constant, λ, of Ni81Fe19, Ni81Fe19/Ta and Ni72Fe17Rh11/ Ta thinfilms were studied as a function of film thickness before and after annealing. For films of thickness t < 200 Å, 4πMs, and λs were found to be strongly dependent on film thickness with even larger variation after annealing. Auger depth profiles have shown the existence of inhomogeneous interfacial layer at the film surface, Ta/film and film/substrate interfaces. The presence of such layer… Show more

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Cited by 22 publications
(15 citation statements)
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“…The saturation magnetization, Ms, can take values between 700 kA/m to 860 kA/m [19][20][21][22][23]. We found by VSM (vibrating sample magnetometer) measurements, on magnetic thin films with Permalloy (10 nm), that M S = 710 kA/m, which is in agreement with [22], which shows a decrease of the saturation magnetization for very thin films. For the exchange constant, A, values between 10 pJ/m [20] to 13 pJ/m are reported [19,21,23].…”
Section: Characterization Of the Gmr Sensorsupporting
confidence: 63%
See 1 more Smart Citation
“…The saturation magnetization, Ms, can take values between 700 kA/m to 860 kA/m [19][20][21][22][23]. We found by VSM (vibrating sample magnetometer) measurements, on magnetic thin films with Permalloy (10 nm), that M S = 710 kA/m, which is in agreement with [22], which shows a decrease of the saturation magnetization for very thin films. For the exchange constant, A, values between 10 pJ/m [20] to 13 pJ/m are reported [19,21,23].…”
Section: Characterization Of the Gmr Sensorsupporting
confidence: 63%
“…For simulations, we assumed M s = 710 kA/m (saturation magnetization), A = 1.3 × 10 −11 J/m (exchange constant), and an anisotropy constant, K U = 804 J/m 3 along Ox axis. These are typical material parameters used in micromagnetic simulations [19][20][21][22][23]. The cell size is determined by the exchange length, l ex , which for Permalloy is 5 nm [20].…”
Section: Characterization Of the Gmr Sensormentioning
confidence: 99%
“…The M-dependent signal at 1 nm is below the experimental noise floor, indicating little or no ferromagnetic response for these very thin air-exposed films. We have verified that the loss of SH-MOKE, which is consistent with the observed suppression of ferromagnetism in thin NiFe-alloy films due to oxidation, 7 indeed correlates with the loss of ferromagnetism, using vibrating-sample magnetometry.…”
supporting
confidence: 81%
“…For the amorphous FeCoBSi layer one can assume thickness independent piezomagnetism down to a few nm as long as the stoichiometry is retained. 44 For the hexagonal wurtzite AlN structure the piezoelectric coefficient decreases below 500nm thickness 45,46 and dielectric losses which are critical for noise in sensors increase. Recently near bulk piezoelectric properties were achieved for 10nm AlN.…”
Section: Resultsmentioning
confidence: 99%
“…High piezoelectricity near bulk values has been achieved for 10nm thick AlN 42 and high piezomagnetism is expected in amorphous FeCoBSi down to a few nm thickness. 44 At smaller thicknesses microscopic models or models with local or graded properties may be required. The linear constitutive equations (1) -(4) describe the strain S in x-direction for each layer as a function of stress T and external fields.…”
Section: Theorymentioning
confidence: 99%