Thickness Control of Graphene Overlayer via Layer-by-Layer Growth on Graphene Templates by Chemical Vapor Deposition

Negishi, Ryota; Hirano, Hiroki; Ohno, Yasuhide; Haehashi, Kenzo; Matsumoto, Kazuhiko; Kobayashi, Yoshihiro

doi:10.1143/jjap.50.06ge04

Cited by 13 publications

(9 citation statements)

References 32 publications

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“…Compared with previously reported graphene synthesis on Cu and Ni foil using the CVD method the graphene obtained from this experiment consisted of various layers of graphene due to the segregation and precipitation mechanisms of graphene growth on the Ni foil. 12,13) …”

Section: Introductionmentioning

confidence: 99%

Graphene Converted from the Photoresist Material on Polycrystalline Nickel Substrate

Lee

Hong

et al. 2012

Jpn. J. Appl. Phys.

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Graphene has attracted attention from both academia and industry owing to its fascinating properties and a wide range of potential applications. Methods for graphene synthesis from solid and liquid carbon sources, including poly(methyl methacrylate) (PMMA), benzene, and other carbon sources, have been reported due to the potential use of a wide variety of carbon feedstocks. In this study, high quality graphene was grown from SU-8-2002 photoresist materials on Ni foil with annealing at 1000 C for 20 min in an ambient mixture of He and H 2 gas. Scanning electron microscopy image of the as-synthesized graphene on Ni foil indicated that graphene covered the whole area of the Ni foil with various numbers of layers due to the different carbon segregation rate depending on the underlying Ni grain orientation. To unambiguously distinguish the thickness variation of the synthesized graphene layers, they were transferred onto SiO 2 (300 nm)/Si substrate and were analyzed using optical microscopy, and Raman spectroscopy, which confirmed that the synthesized graphene is composed of various numbers of layers. The thickness dependent G/2D peak intensity ratio (I G =I 2D ) of Raman spectra and their full width at half maximum values obtained from the transferred graphene layers were examined, which were in good accordance with atomic force microscopy analyses. #

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Section: Introductionmentioning

confidence: 99%

Graphene Converted from the Photoresist Material on Polycrystalline Nickel Substrate

Lee

Hong

et al. 2012

Jpn. J. Appl. Phys.

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“…Very recently, although the origin of graphene growth is different from that in our case, similar graphene overgrowth on a graphene layer was reported. 16) The resultant graphene film has a thickness equal to the height of the facet originating from graphene growth. However, there are still various open issue including the accurate determination of the plane direction of the facets originating from graphene growth and whether the growing point of the graphene layer is a facet or the tip of the layer.…”

mentioning

confidence: 99%

Low-Temperature Graphene Growth Originating at Crystalline Facets of Catalytic Metal

Yamazaki

Wada

Kitamura

et al. 2012

Appl. Phys. Express

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We explored the characteristic behavior of low-temperature graphene growth on catalytic metal films. The results suggested that graphene growth originates from the crystalline facets with specific angles with respect to the crystalline orientation of the catalytic metals at low temperatures, which is different from the conventional growth models. The G/D ratio of the Raman spectrum of the graphene film was affected by both the number of specific facets and the width of the terrace. Because of this behavior, it is important to prepare the surface conditions with a smaller number of facets and a wider terrace for high-quality graphene growth at low temperatures.

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“…10,11) If the ethanol flow rate exceeds the rate used here, the formation of multilayer graphene proceeds through graphene overlayer growth. [19][20][21] 3. Results and discussion Figure 1(a) shows the optical and AFM images of a mechanically exfoliated graphene flake.…”

Section: Methodsmentioning

confidence: 99%

Investigation of surface potentials in reduced graphene oxide flake by Kelvin probe force microscopy

Negishi¹,

Takashima²,

Kobayashi³

2018

Jpn. J. Appl. Phys.

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The surface potential (SP) of reduced graphene oxide (rGO) flakes prepared by thermal treatments of GO under several conditions was analyzed by Kelvin probe force microscopy. The low-crystalline rGO flakes in which a significant amount of oxygen functional groups and structural defects remain have a much lower SP than mechanically exfoliated graphene free from oxygen and defects. On the other hand, the highly crystalline rGO flake after a thermal treatment for the efficient removal of oxygen functional groups and healing of structural defects except for domain boundary shows SP equivalent to that of the mechanically exfoliated graphene. These results indicate that the work function of rGO is sensitively modulated by oxygen functional groups and structural defects remaining after the thermal reduction process, but is not affected significantly by the domain boundary remaining after the healing of structural defects through the thermal treatment at high temperature.

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Thickness Control of Graphene Overlayer via Layer-by-Layer Growth on Graphene Templates by Chemical Vapor Deposition

Cited by 13 publications

References 32 publications

Graphene Converted from the Photoresist Material on Polycrystalline Nickel Substrate

Graphene Converted from the Photoresist Material on Polycrystalline Nickel Substrate

Low-Temperature Graphene Growth Originating at Crystalline Facets of Catalytic Metal

Investigation of surface potentials in reduced graphene oxide flake by Kelvin probe force microscopy

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