Thickness and Conductivity of Metallic Layers from Pulsed Eddy Current Measurements

Opening-mode fractures of a brittle coating bonded to an elasto-plastic substrate

“…Since the aluminum substrate used in this experiment was non-ferrous and the alumina coating was non-conducting, a pulsed eddy-current instrument (PEC) was used to determine the thickness of the non-conducting layer above the non-ferrous substrate (Tai et al, 1996). In this study, a Fischer DUALSCOPE-FMP20 PEC device was used to determine these alumina layer thicknesses, which was able to accurately determine the coating thickness with a resolution of about 0.01 lm.…”

Contribution to the modeling of a voltage driven pulsed eddy current sensor for the characterization of conductive plates

“…Pulsed eddy current nondestructive testing is widely used for the characterization of deep flows in ferromagnetic materials and the characterization of the electromagnetic properties as well as the thickness of metallic plates [1,2].…”

“…Analytical and numerical models have been developed [1][2][3][4][5][6]. However, to simplicity the modeling, the current density is commonly imposed in the sensor and the induced voltage or the scattered flux density variation is used as the information-bearing signal for the characterization of the tested material.…”

Characterization of Coatings on Magnetic Metals Using Swept-Frequency Eddy Current and Transient Eddy Current Methods

“…and (6) The impedance ofthe coil above a layer-free reference half-space is given by (7) We measure the coil impedance for the coil above single layered half-space and a half-space of the base material. The impedance difference, LIZ, of the impedance for these two cases is reported.…”

“…Sethuraman and Rose [5] developed a more rapid (several seconds on the same processor) solution that was based on isolating three characteristic features of the frequency-domain response and then relating the thickness and conductivity to these features. Tai, Rose and Moulder [6] developed a transient eddy current method that can determine the thickness and the conductivity of a conducting layer over a metal substrate of known conductivity. A rapid inversion method based on a look-up table was developed to determine the thickness and conductivity.…”