Thickness analysis of LiF thin films by using 7Li(p,n) and 19F(p,αγ) nuclear reactions

Kim, Gi-Dong; Choi, Hunsoo; Park, Jung-Heun

doi:10.3938/jkps.62.413

Journal of the Korean Physical Society

2013

DOI: 10.3938/jkps.62.413

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Thickness analysis of LiF thin films by using 7Li(p,n) and 19F(p,αγ) nuclear reactions

Gi-Dong Kim

Hunsoo Choi

Jung-Heun Park

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Thickness analysis of LiF thin films by using 7Li(p,n) and 19F(p,αγ) nuclear reactions

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