1974
DOI: 10.1063/1.1663833
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Thick specimens in the CEM and STEM. I. Contrast

Abstract: Calculations have been performed on the contrast available in thick specimens. Ten modes of operation have been considered, six in the conventional electron microscope (CEM) and four in the scanning transmission electron microscope (STEM). Electrons passing through the specimen fall into four categories, elastically scattered, inelastically scattered, unscattered, and those scattered both elastically and inelastically. For the various operation modes these groups are taken in combinations to form practical sig… Show more

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Cited by 52 publications
(14 citation statements)
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“…Crewe and Groves have described the considerations that must be made to calculate the image intensities for thick specimens and explicitly calculated the thickness contrast from carbonaceous specimens with and without energy filtration [33]. We have used a similar approach to calculate the density contrast from biological molecules embedded in thick layers of ice.…”
Section: Multiple Scatteringmentioning
confidence: 99%
“…Crewe and Groves have described the considerations that must be made to calculate the image intensities for thick specimens and explicitly calculated the thickness contrast from carbonaceous specimens with and without energy filtration [33]. We have used a similar approach to calculate the density contrast from biological molecules embedded in thick layers of ice.…”
Section: Multiple Scatteringmentioning
confidence: 99%
“…6 Some of the nanoscale devices, however, are fabricated on a thick substrate ͑Ͼ100 m͒ which does not allow the electron beam to penetrate the device. High-resolution imaging methods such as scanning electron microscopy ͑SEM͒, transmission electron microscopy ͑TEM͒, and scanning transmission electron microscopy ͑STEM͒ have provided direct evidence of nanoscale phenomena using recently developed in situ imaging techniques.…”
Section: Introductionmentioning
confidence: 99%
“…There have been numerous useful mass measurements of thin specimens (e.g. Engel, 1978;Lamvik, 1978;Reedy et al, 1981;Wall et al, 1983) but few of the mass distribution within thick structures (Crewe & Groves, 1974), where demands on the signal-tonoise ratio of the original image are greater. Concentration determinations by microanalysis of volatile elements or of elements in unstable matrices will be improved with reduced mass loss.…”
Section: Discussionmentioning
confidence: 99%