Thick multi-layers analysis using high energy PIXE

Abstract

A method for multi-layer analysis using high energy PIXE is described. It is based on the variation of the Kα K β ratio as a function of the detection angle. This method can provides the thicknesses and the sequences of multi-layers targets. Experiments have been carried out at the ARRONAX cyclotron using 70 MeV protons in order to test this method. The thicknesses and the sequences of simple multi-layers targets and also of more complex targets with hidden layers have been determined using this method.

High energy PIXE: A tool to characterize multi-layer thick samples

“…The normalization of ∆µ • d by 1 cos(θ 2 ) − 1 cos(θ 1 ) remove the angular dependancy. This point has been already experimentaly demonstrated [13].…”

“…, where E is the energy of the considered X-ray, N A is the Avogadro constant and Z, A, ρ, d are the effective atomic number, mass number, density and thickness of the layers placed in front of the emitting one. The comparison between (∆µ • d) values for each detected elements allows to determine the sequences of the layers (demonstrated in [13]).…”

“…Kα ) ratio. This study is an extention of the previous method [13] and it is a step further to develop an acurate quantitative method in order to analyze cultural heritage samples later on. Firstly the experimental setup is described.…”

“…Secondly, the key parameters of the method such as the self attenuation and the impact of the layer placed in front of the emitting one are described. Finally, the extension of the previous method [13] to the analysis of a multi-layer sample with a repeated layer is presented.…”

“…However, HEPIXE analysis using Kα K β (or Kα Lα , Lα L β ) ratio provides qualitative information about the thicknesses and the sequences of several layers but assumptions on the sample composition is required [12]. In a recent work [13], we demonstrate the possibility to perform quantitative analysis of simple multi-layer samples without any assumption on their composition. This method, based on the relative variation of Kα K β (or Kα Lα ,…”