2018
DOI: 10.1017/s1431927618001344
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Thick (3D) Sample Imaging Using iDPC-STEM at Atomic Scale

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Cited by 7 publications
(9 citation statements)
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“…When increasing the CSA and the probe is aberration-free, higher resolution is obtained while the beam depth of focus becomes smaller. Consequently, when the sample thickness exceeds the decreasing beam-waist length, the images represent optical depth sections rather than projections 50 , 53 . We estimate that the sample regions imaged here have thicknesses of 18 to 54 nm corresponding to a diameter of a single TMV rod and three TMV rods, respectively.…”
Section: Discussionmentioning
confidence: 99%
“…When increasing the CSA and the probe is aberration-free, higher resolution is obtained while the beam depth of focus becomes smaller. Consequently, when the sample thickness exceeds the decreasing beam-waist length, the images represent optical depth sections rather than projections 50 , 53 . We estimate that the sample regions imaged here have thicknesses of 18 to 54 nm corresponding to a diameter of a single TMV rod and three TMV rods, respectively.…”
Section: Discussionmentioning
confidence: 99%
“…When increasing the CSA, higher resolution is obtained provided the probe is aberration free while the beam depth of focus becomes smaller. Consequently, when sample thickness exceeds the decreasing beam-waist length, the images represent optical depth sections rather than projections [45,48]. We estimate that the sample regions imaged here have thicknesses of 18 to 54 nm corresponding to a diameter of a single TMV rod and three TMV rods, respectively.…”
Section: Discussionmentioning
confidence: 95%
“…The value of the defocus is only limited by the specimen thickness, as it is the depth at which the projected electrostatic potential is probed by the converged beam waist allowing atomically resolved 3D iDPC imaging (49). In addition, it shows enhanced contrast between the hydrogen and titanium columns as plotted in Figure S11C.…”
Section: Multislice Simulations Of the γ-Tih Unit Cell With And Withomentioning
confidence: 99%
“…List of the electron detectors and their corresponding collection angles that are used in the experiment and simulation. References (42)(43)(44)(45)(46)(47)(48)(49)(50)(51)…”
Section: Supplementary Materialsmentioning
confidence: 99%