2008
DOI: 10.1016/j.tsf.2008.08.194
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Thermomechanical properties and mechanical stresses of Ge2Sb2Te5 films in phase-change random access memory

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Cited by 104 publications
(69 citation statements)
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“…For ultrafast processes such as those in the current experiment, the electron and lattice subsystems are not initially in equilibrium, leading to two independent contributions (and two different subsystem temperatures) to lattice expansion as exemplified by the electronic and lattice Grüneisen parameters, respectively [28]. The more than a factor of 4 increase in the thermal expansion coefficient α L over the published value [29] of 1.74 × 10 −5 K −1 found in the current fitting may reflect the contributions of the electronic Grüneisen parameter to the induced stress in the film. As the system can only expand along the z direction, an increase of up to a factor of 3 in α L might be anticipated due to the decrease in dimensionality, but the factor of 4 found here suggests additional contributions from electronic excitation effects [5].…”
Section: Discussionmentioning
confidence: 72%
“…For ultrafast processes such as those in the current experiment, the electron and lattice subsystems are not initially in equilibrium, leading to two independent contributions (and two different subsystem temperatures) to lattice expansion as exemplified by the electronic and lattice Grüneisen parameters, respectively [28]. The more than a factor of 4 increase in the thermal expansion coefficient α L over the published value [29] of 1.74 × 10 −5 K −1 found in the current fitting may reflect the contributions of the electronic Grüneisen parameter to the induced stress in the film. As the system can only expand along the z direction, an increase of up to a factor of 3 in α L might be anticipated due to the decrease in dimensionality, but the factor of 4 found here suggests additional contributions from electronic excitation effects [5].…”
Section: Discussionmentioning
confidence: 72%
“…GST materials are also leading candidates for computer random access memory (PC-RAM) [17][18][19] and are expected to provide non-volatile memory in future low-energy electronic devices. The phase change in PCRAMs is initiated by resistive heating, and the state is monitored by measuring the resistivity [20].…”
Section: Introductionmentioning
confidence: 99%
“…with specific heat C, linear expansion coefficient b, band gap E g , and photon energy E. For C $ 10 6 J/m 3 K, b $ 10 À5 K À1 , and ðE À E g Þ $ 1 eV, 14,28,29 the electronic and thermal contributions are equal and opposite for jdE g =dPj $ 0:03 eV/GPa. This is on the order of previously measured results.…”
mentioning
confidence: 99%