Thermoluminescence glow curve deconvolution for discrete and continuous trap distributions

Advanced Thermoluminescence Spectroscopy as a Research Tool for Semiconductor and Photonic Materials: A Review and Perspective

“…Deconvolution of the glow curve demands a rigorous analysis to resolve into its individual peaks and calculate the parameters of traps/localized states and several codes and algorithms have been developed to fit the glow curve and extract the parameters of the localized states. [65][66][67][68][69][70] Since the focus of this article is to review TL applications in semiconductors, demonstrate its advantages in this area, and guide the reader on data interpretation and their physical meaning, the mathematical description of TL and the different methods for trap parameter calculations will not be discussed here. For that, we refer the reader to Ref.…”

Use of Terbium Doped Phosphate Glasses for High Dose Radiation Dosimetry—Thermoluminescence Characteristics, Dose Response and Optimization of Readout Method

“…Such a combined approach to TL glow curve analysis has already been applied and reported in literature [49]. The glow peaks following first (FOK) and general order kinetics (GOK) were fitted using Equations ( 5) and ( 6) [48,50]:…”

“…where I and I m are TL intensities for a given temperature (T, in K) or at peak maximum (Tm) and temperature linearly increases with time (t) from T 0 to T, T(t) = T 0 + βt, β ( • C/s) is the linear heating rate; E (eV) is the trap activation energy; k (eV•K −1 ) is the Boltzmann constant; and b is the kinetic order parameter. In case of continuous energy distribution of traps present in material, usually exponential or gaussian functions are used, which can be described by Equations ( 7) and ( 8) [49][50][51]:…”

“…Based on these distributions, two models are generally in use, describing dependencies of TL emission intensity vs. energy and temperature according to Equations ( 9) and ( 10): (10) where s (s −1 ) is the frequency coefficient related to the type of defect and other symbols are as described above. The models described according to Equations ( 5)-( 10) are implemented in a dedicated glow curve deconvolution software and are described in several papers [49,50]. The software was used for analysis of glow curves obtained during measurement of PPG sample, and graphical representation of the obtained results are presented in Figure 10.…”

“…The deconvolution procedure was performed in order to recognize the structure of the TL glow curve, structure, and types of defects present in the material and to estimate the energy levels of the trapping centers related to the particular TL emissions from the material. Verification of the proper localization of particular peaks was based on the consecutive analysis of the experimental data and results obtained from deconvolution analysis using the GCA (Glow Curve Analysis) software [50]. The selection between exponential and gaussian distributions for continuous type defects was made taking as a criterion the possibly lowest value of FOM (Figure of Merit) parameter, which indicates the difference between experimental data and computer-simulated glow curves based on the parameters obtained during deconvolution procedure.…”