The nanostructure formation in polyimide-fullerene composites during thermal treatment was investigated ''in situ'', by means of wide-angle (WAXS) and small-angle X-ray scattering techniques. The WAXS patterns of the PI composites do not reveal the presence of C 60 reflections. However, the PI/C 60 composite, obtained by adding the C 60 solution to the diamines-solution during the first step of the reaction (preparation of the polyamic acid, PAA), shows a maximum at small X-ray scattering angles. Results show that this intensity maximum is markedly affected by thermal treatment of the PI/C 60 composite, disappearing at high temperature. From ''in situ'' X-ray scattering experiments, the ''manner'' in which the C 60 nanoparticles are added to the other reactants and influences the properties of the final polymer is discussed.