2014
DOI: 10.1016/j.jallcom.2013.07.127
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Thermally-induced crystallization behaviour of 80GeSe2–20Ga2Se3 glass as probed by combined X-ray diffraction and PAL spectroscopy

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Cited by 44 publications
(57 citation statements)
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“…Indeed, under the condition that I 3 * ≅ I 3 host , the decreasing I 2 * intensities in Equation 6 provide negative values for I int . Thus, in full agreement with previous conclusion extracted from x2-decomposed PAL spectra [10], the I int. intensities attain firstly negative values, this process being quickly saturated in a 50-h annealed sample.…”
Section: Resultssupporting
confidence: 92%
See 1 more Smart Citation
“…Indeed, under the condition that I 3 * ≅ I 3 host , the decreasing I 2 * intensities in Equation 6 provide negative values for I int . Thus, in full agreement with previous conclusion extracted from x2-decomposed PAL spectra [10], the I int. intensities attain firstly negative values, this process being quickly saturated in a 50-h annealed sample.…”
Section: Resultssupporting
confidence: 92%
“…= −0.014), while host and 50-h annealed glasses are under obvious void fragmentation (appearance of new positron-trapping sites). The bulk positron lifetimes in all samples are smaller than previously observed τ b ≅ 0.260 ns [10], corresponding to positron trapping occurring just in the nanocrystalline particles itself. The appeared/disappeared interfacial free-volume voids are not too large, since the characteristic value of τ int = 0.27 to 0.30 ns lifetime can be associated with typical volumes of mono-or diatomic vacancies in chalcogenide-like systems [1,3,[14][15][16].…”
Section: Resultscontrasting
confidence: 72%
“…Measurements were performed at room temperature (293 K) and ambient humidity (35 %). A series of a few independent experiments were connected with samples of the same prehistory to exclude data scatter because of differences between actual status of samples and uncontrolled instabilities in the experimental setting of PALS spectrometer [11]. The obtained results agreed well with each other within experimental uncertainties, being no more than ±0.005 ns in lifetimes and ±0.01 in component intensities.…”
Section: Methodsmentioning
confidence: 60%
“…The error-bars are ±0.03 ns for lifetimes, ±0.01 arb. units for intensities and ±0.01 ns -1 for positron trapping rate of defects [41,44]. Let's try to discuss the results (Table 1) obtained within positron trapping model by accepting that structural peculiarities of spinel ceramics is associated mainly in the first PAL component (τ 1 , I 1 ).…”
Section: Methodsmentioning
confidence: 99%