Thermal stability of a defect-tolerant dielectric

Boggs, S.A.

doi:10.1109/61.311224

Cited by 6 publications

(2 citation statements)

References 6 publications

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“…With typical parameters such as ε=3.6, κ=0.2 W/m-K, Ec= 500 kV/mm, and R sc such that Σ reaches 25 MPa, the typical yield stress for a polymer, the temperature rise as determined from the above is about 1.7 K for 5 μm tip but 160 K for 50 μm tip, which suggests that temperature rise can only be ignored at small tip radii. These results are in general agreement with the transient nonlinear finite element simulations with coupled thermal and electric fields [5][6][7] and justify the above assertion that very high field phenomena can only occur on a microscopic basis.…”

Section: Space Charge Limited Fieldsupporting

confidence: 89%

Very high field phenomena in dielectrics

Boggs

2005

IEEE Trans. Dielect. Electr. Insul.

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Understanding of very high field phenomena in polymeric dielectric is reviewed, based on the concepts of field-dependent conductivity and space charge limited field, which leads to the conclusion that the electric field distribution can be predicted with reasonable accuracy under high field conditions. Other phenomena, such as photon emission, cannot be predicted reliably, probably because the concepts underlying the entire theory, that of "traps" or "impurity levels" within the band gap, are not understood, i.e., while the theory is written in terms of such concepts, no convincing physical basis for these phenomena has been provided. This issue is discussed and some suggestions possible directions for future research are suggested.

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Section: Space Charge Limited Fieldsupporting

confidence: 89%

Very high field phenomena in dielectrics

Boggs

2005

IEEE Trans. Dielect. Electr. Insul.

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“…When the field at the interface between a conductor and the dielectric exceeds a "critical field", space charge forms in the dielectric to limit the field as a function of frequency or time constant [135][136][137]. This space charge formation results in substantial current densities, electromechanical forces, and power dissipation [118,[138][139][140][141] which, in various combinations depending on operating conditions, contribute to electrical tree initiation.…”

Section: Temperature Risementioning

confidence: 99%

Study on electrical characteristics of XLPE insulation of high voltage cable

Yang¹

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Development of 500-kV XLPE cables and accessories for long distance underground transmission lines-Part II: jointing techniques

Kubota

Takahashi

Hasegawa

et al. 1994

IEEE Trans. Power Delivery

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Ahs tractThis paper reports on the results of B basic inquqr for the purpose of developing extrusion-molded joints (EMJ) for use with 500-kV XLPE cable. The Ruthors have made it clear that the itlctors that govern FMJ perfomance, like cable perqormance, are contaminants in the insulation and protruslons in the semiconductor layer. Through modeling experiments we determined the minimum breakdown strength of EMJ and used this to determine desfgn values for 500-kV P I . Fjnally, we carried out breakdown tests on actual equipment, resulting in the prospect of the pctual realizatfon of 500-kV EM.1.

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Thermal stability of a defect-tolerant dielectric

Cited by 6 publications

References 6 publications

Very high field phenomena in dielectrics

Very high field phenomena in dielectrics

Study on electrical characteristics of XLPE insulation of high voltage cable

Development of 500-kV XLPE cables and accessories for long distance underground transmission lines-Part II: jointing techniques

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