Thermal radiation characteristics of plane-parallel SiC wafer

Han, Maohua; Liang, Xin-Gang; Huang, Yong

doi:10.1007/bf02897568

Cited by 4 publications

(5 citation statements)

References 13 publications

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“…Basically, the coherence phenomena are similar for different films, such as SiC, Si, Ge, etc. in which SiC is a little bit special [20] . Its index between 10.38 and 11.64 μm is less than 0.1 (smaller than that of air) and total reflection easily happen when the radiation is from air.…”

Section: Resultsmentioning

confidence: 99%

“…If radiation is in normal direction, the refractive angle will be zero degree. At interface 1 the electric field vectors are given by 1 11 12…”

Section: Theoretical Modelmentioning

confidence: 99%

“…Liang and Han investigated the thermal radiation characteristics of SiC wafers. They found that the sharp spectral peaks and narrow angular lobes of SiC wafers contributed nothing to the total hemispherical emissivity [11] . The above peculiarities of ARTICLES ENGINEERING THERMOPHYSICS thermal radiation are caused by the resonator property of films and are not related to excitation of the surface waves.…”

Section: Introductionmentioning

confidence: 99%

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Coherent thermal radiation in thin films and its application in the emissivity design of multilayer films

Liang

Han

2007

CHINESE SCI BULL

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The infrared transmission spectra of a 0.54-μm-thick Ge film and a 20-μm-thick Si film were experimentally measured. As the incident radiation was in the wavelength range from 1.5 μm to 10 μm, the Ge film demonstrated a strongly spectral coherence. However, thermal radiation of the Ge film was found to be spatially incoherent due to its extreme thinness. The Si film exhibited significantly spectral and spatial coherence. The results confirmed that thermal radiation of a monolayer film could be coherent spectrally and spatially if the film thickness was comparable with the wavelength. The optical characteristic matrix method was applied to calculate the transmission spectra of the Si and Ge film, and the results agreed well with the measurements. This method was further used to analyze two multilayer films composed of five low emissive layers. Their emissivities were found to be highly emissive at a certain zenith angle, and the emissive peak could be controlled by careful selection of film thickness.thermal radiation, thin film, cvoherence, emissivity, multilayer film

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Section: Resultsmentioning

confidence: 99%

“…If radiation is in normal direction, the refractive angle will be zero degree. At interface 1 the electric field vectors are given by 1 11 12…”

Section: Theoretical Modelmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Coherent thermal radiation in thin films and its application in the emissivity design of multilayer films

Liang

Han

2007

CHINESE SCI BULL

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“…In the case that the thin film is thicker than the incident wave length, photon tunneling effects still exist. The results show that interference effect [15] and photon tunneling effect play important roles in thermal radiant property of the NIM.…”

Section: The Influence Of Evanescent Waves On Polarization Characterimentioning

confidence: 96%

TM polarization characteristics on thermal radiation of a negative refractive index thin film

et al. 2009

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“…Han et al [82] investigated the spectral and directional absorptivity of plane-parallel SiC wafer in the IR region. They used a model that took into account the wave phase and interference of radiation [83] .…”

Section: Interface Effect On Thermal Radiation Of Multi-layer Thin Filmmentioning

confidence: 99%

Some effects of interface on fluid flow and heat transfer on micro- and nanoscale

Liang

2007

CHINESE SCI BULL

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The interfacial effects on flow and heat transfer on micro/nano scale are discussed in this paper. Different from bulk cases where interfaces can be simply treated as a boundary, the interfacial effects are not limited to the interface on a microscale but could extend into a significant, even the whole domain of the flow and heat transfer field when the characteristic size of the domain is close to the mean free path (MFP) of the carriers inside an object. Most of microscale thermal phenomena result from interfacial interactions. Any changes in the interactions between the object and boundary particles, such as the force between fluid and solid wall particles, microstructure of interfaces, could affect thermal properties, flow and heat transfer characteristics and hence change thermal conductivity, velocity and temperature profiles, friction coefficient and thermal radiative properties, etc. The properties of nanostructure or flow and heat transfer features of fluid in micro/nanostructures not only depend on themselves, but also on the interaction with the interface because the interface impact can go deep inside the flow. The same fluid, same channel geometry but different wall materials could have different flow and heat transport characteristics on microscale.

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Thermal radiation characteristics of plane-parallel SiC wafer

Cited by 4 publications

References 13 publications

Coherent thermal radiation in thin films and its application in the emissivity design of multilayer films

Coherent thermal radiation in thin films and its application in the emissivity design of multilayer films

TM polarization characteristics on thermal radiation of a negative refractive index thin film

Some effects of interface on fluid flow and heat transfer on micro- and nanoscale

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