“…RBS is well established, as one of the most quantitative and versatile techniques of ion beam analysis, which provides elemental composition (1-5% accuracy), quantitative analysis (±2%), elemental depth resolution of 5-50 nm and a maximum depth of 2-20 lm, and diffusion depth profiles (Dahbi and Arafah, 2014). This technique was used by other authors to study the thermal stability of selective solar absorber coatings (Yin et al, 2007;Tornquist et al, 1997;Kaluza et al, 2001). Fig.…”