Thermal Origin of Readout Mechanism of Light-Scattering Super-Resolution Near-Field Structure Disk

Kuwahara, Masashi; Shima, Takayuki; Kolobov, Alexander V.; Tominaga, Junji

doi:10.1143/jjap.43.l8

Cited by 40 publications

(37 citation statements)

References 2 publications

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“…Kuwahara et al 9 and Tominaga et al 12 have previously reported that temperature increase inside the disc plays a role in the super-resolution readout. The material study suggested an advantage of adjusting the composition (of binary compound) to the one of a eutectic point.…”

Section: Discussionmentioning

confidence: 99%

“…8 These two properties are probably important to increase temperature by laser irradiation, and the temperature increase is suggested to play an important role in the super-resolution readout. 9 Fig. 2 shows the maximum carrier-to-noise ratios (CNRs) obtained at 200-nm mark trains when varying the composition of Zn x Sb 100-x .…”

Section: Materials Selection Study Of Super-resolution Readout Layermentioning

confidence: 99%

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Material selection and disc structure optimization studies for super-resolution readout with PtOx recording layer

et al. 2007

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Section: Discussionmentioning

confidence: 99%

Section: Materials Selection Study Of Super-resolution Readout Layermentioning

confidence: 99%

Material selection and disc structure optimization studies for super-resolution readout with PtOx recording layer

et al. 2007

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“…In fact, for ROM disk, premastered pits were located on the incident laser light side and the mask layer, on which the apertures were generated, worked as a reflective layer at the same time because the reflected signals were picked up for readout. The nanoapertures, formed by precipitation of metallic particles or refractive index modulation, 13,14 combined with the Gaussian laser light and interacted with the recording pits in the near field. The mesoscopic interaction of nanoaperture-modulated reflected light wave with recording pits might be the origin of superresolution readout.…”

Section: Methodsmentioning

confidence: 99%

Read-only memory disk with <inline-formula><math display="inline" overflow="scroll"><msub><mi>AgO</mi><mrow><mi>x</mi></mrow></msub></math></inline-formula> and AgInSbTe superresolution mask layer

Zhang

Wang

et al. 2005

Opt. Eng

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Abstract. Two novel read-only memory (ROM) disks, one with an AgO x mask layer and the other with an AgInSbTe mask layer, are proposed and studied. The AgO x and the AgInSbTe films sputtered on the premastered substrates with pit depths of 50 nm and pit lengths (space) of 380 nm are studied by atomic force microscopy. Disk readout measurement is carried out using a dynamic setup with a laser wavelength of 632.8 nm and an object lens numerical aperture (NA) of 0.40. Results show that the superresolution effect happens only at a suitable oxygen flow ratio for the AgO x ROM disk. The best superresolution readout effect is achieved at an oxygen flow ratio of 0.5 with the smoothest film surface. Compared with the AgO x ROM disk, the AgInSbTe ROM disk has a much smoother film surface and better superresolution effect. A carrierto-noise ratio (CNR) of above 40 dB can be obtained at an appropriate readout power and readout velocity. The readout CNR of both the AgO x and AgInSbTe ROM disks have a nonlinear dependence on the readout power. The superresolution readout mechanisms for these ROM disks are analyzed and compared as well. © 2005 Society of Photo-Optical Instrumentation Engineers.

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“…For the semiconductor InSb, the increase of the extinction coefficient is believed to be due to the decrease of the band gap energy E g as function of the temperature, as demonstrated by Ohkubo et al [12]. Hence, the Super-RENS technique is a very active field that has attracted many researchers, due to its advantages over other near field techniques [13][14][15][16][17]. From a practical point of view, it is essential to understand the effect of the opened optical aperture/scatterer on the profile and intensity of the focused laser spot, regardless of its cause.…”

Section: Introductionmentioning

confidence: 99%

Direct measurement of the near-field super resolved focused spot in InSb

Assafrao¹,

Wachters²,

Verheijen³

et al. 2012

Opt. Express

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Under appropriate laser exposure, a thin film of InSb exhibits a sub-wavelength thermally modified area that can be used to focus light beyond the diffraction limit. This technique, called Super-Resolution Near-Field Structure, is a potential candidate for ultrahigh density optical data storage and many other high-resolution applications. We combined near field microscopy, confocal microscopy and time resolved pump-probe technique to directly measure the induced sub-diffraction limited spot in the near-field regime. The measured spot size was found to be dependent on the laser power and a decrease of 25% (100nm) was observed. Experimental evidences that support a threshold-like simulation model to describe the effect are also provided. The experimental data are in excellent agreement with rigorous simulations obtained with a three dimensional Finite Element Method code.

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Thermal Origin of Readout Mechanism of Light-Scattering Super-Resolution Near-Field Structure Disk

Cited by 40 publications

References 2 publications

Material selection and disc structure optimization studies for super-resolution readout with PtOx recording layer

Material selection and disc structure optimization studies for super-resolution readout with PtOx recording layer

Read-only memory disk with <inline-formula><math display="inline" overflow="scroll"><msub><mi>AgO</mi><mrow><mi>x</mi></mrow></msub></math></inline-formula> and AgInSbTe superresolution mask layer

Direct measurement of the near-field super resolved focused spot in InSb

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