2021
DOI: 10.1063/5.0054256
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Thermal noise in contact atomic force microscopy

Abstract: As one of the fundamental sources of noise in atomic force microscopy (AFM), thermal fluctuations of the cantilever have been studied for the case of a free tip but not much for cantilevers in contact. In this paper, using the equipartition theorem, we calculated the thermal deflection amplitude for all normal modes of an elastically supported AFM cantilever, including the free cantilever as a special case. With increasing contact stiffness, the mean thermal fluctuation amplitude decreases for all cantilever m… Show more

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Cited by 9 publications
(19 citation statements)
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“…where y(x, t) is the upward deflection of the cantilever with longitudinal direction. y(x, t) can be split into their temporal and spatial contributions; therefore, 36,48 y(x, t) = y(x) cos(ωt…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
See 2 more Smart Citations
“…where y(x, t) is the upward deflection of the cantilever with longitudinal direction. y(x, t) can be split into their temporal and spatial contributions; therefore, 36,48 y(x, t) = y(x) cos(ωt…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
“…for the kinetic energy, 48 where k is the Boltzmann constant and T is the temperature of the cantilever. One must first determine the flexural vibration amplitudes for its cantilever to determine the vibration energy before we can get the overall thermal deflection amplitude.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
See 1 more Smart Citation
“…The calibration of the cantilever was done exactly as previously described by Danalache et al (2020). In brief, the spring constant was calibrated using the thermal noise method in fluid (Ma et al, 2021). On the calibration force-distance-curve the region for linear fit of the extended curve was used for calibration as well as for Young's modulus calibration.…”
Section: Stiffness Assessment Of the Extracellular Matrix And Pericel...mentioning
confidence: 99%
“…For example, in conventional AFM setups, thermal noise is typically well above detection noise at frequencies near the AFM cantilever resonances and it is used to obtain the probe's mechanical properties. However, thermal noise also poses a detection limit, which hinders the sensitivity potential of advanced sensors [e.g., AFM (18,19) and microelectromechanical systems (20)(21)(22)] at room temperature.…”
Section: Introductionmentioning
confidence: 99%