Thermal monitoring on FPGAs using ring-oscillators

Boemo, Eduardo; López-Buedo, Sergio

doi:10.1007/3-540-63465-7_212

Cited by 46 publications

(21 citation statements)

References 2 publications

(2 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Boemo and López-Buedo in [21] showed that the frequency of a ring oscillator is a linear function of power supply in the operation range. Hence, if the responses of a RO-PUF, generated with the same challenge at the minimum and the maximum voltages respectively, are equal, as the pair shown in Figure 4(a), the CRP is stable even when the supply voltage varies from the minimum voltage to the maximum voltage.…”

Section: B a Methods To Enroll Stable Crps Against Voltage Variationmentioning

confidence: 99%

See 1 more Smart Citation

A Novel Technique for Ring Oscillator Based PUFs to Enroll Stable Challenge Response Pairs

Bai

2014

2014 IEEE International Conference on Computer and Information Technology

View full text Add to dashboard Cite

Silicon physical unclonable function (PUF) exploits random variations in the manufacturing process to extract unique information for each chip. As one of the most popular techniques to implement a PUF, ring oscillator based PUF (RO-PUF) is easy to implement for both ASIC and FPGA. However, RO-PUF suffers from the lack of reliability caused by temperature and supply voltage variations. In this paper, we proposed a post-processing technique to improve the reliability of RO-PUF. The main idea is that we allow RO-PUF to generate unstable responses as long as we can find means to filter them out during enrollment. Our proposed scheme generates a signal indicating whether the response is stable, and we could filter out unstable challenge response pairs depending on this signal during enrollment. Experimental results showed that the error rate of challenge response pairs enrolled by our proposed scheme was reduced from 19.94% to 0.35% due to voltage variation, and it was reduced from 6.65% to 0.10% due to temperature variation.

show abstract

Section: B a Methods To Enroll Stable Crps Against Voltage Variationmentioning

confidence: 99%

“…How frequency of a ring oscillator varies with temperature and voltage is studied by Boemo and López-Buedo in [21]. They have shown that the frequency of a ring oscillator is a linear function of both the temperature in the normal range of operation, and the power supply in the operation range.…”

Section: A Scheme To Enroll Stable Crpsmentioning

confidence: 98%

A Novel Technique for Ring Oscillator Based PUFs to Enroll Stable Challenge Response Pairs

Bai

2014

2014 IEEE International Conference on Computer and Information Technology

View full text Add to dashboard Cite

show abstract

“…We performed several experiments to verify the ideas [5]- [7]. The last one was to measure the thermal behavior of two 32-bit PLASMA microprocessors, compatible with MIPS-I [8], whose VHDL code was obtained from the opencores.org initiative.…”

Section: Testing a Microprocessor Twin-corementioning

confidence: 99%

Thermal verification on FPGAs

Boemo

López-Buedo

2005

2005 Norchip

View full text Add to dashboard Cite

Esta es la versión de autor de la comunicación de congreso publicada en: This is an author produced version of a paper published in: AbstractThermal verification of complex ICs can help the designer to detect if a particular block is working beyond specifications. A simple method is to extract the output frequencies of an array of ring-oscillators previously distributed in the die. The main advantage is that neither external transducers nor analog parts are necessary. Other possibility is to bias one of the clamping diodes usually present in the pads, and measure its junction forward voltage. In both cases, the measurement of temperature can be done in actual working conditions; that is, with the chip inside the case with its heat sink and fan.

show abstract

“…The utilization of ring-oscillators as thermal sensors on FPGAs was first explored in [9]. The advantages of ringoscillators in a reprogrammable logic framework are multiple: it allows the designer the detection of hot spots or signal contentions [10], as well as the possibility of inserting an array of sensors using dynamic configuration to get a real-time thermal map of the FPGA [11].…”

Section: Introductionmentioning

confidence: 99%

Ring oscillators as thermal sensors in FPGAs: Experiments in low voltage

Franco

Boemo

Castillo

et al. 2010

2010 VI Southern Programmable Logic Conference (SPL)

Self Cite

View full text Add to dashboard Cite

In this paper, some experiments about thermal sensors based on ring-oscillator in low-voltage Virtex series FPGAs are presented. A non linear effect in the frequencytemperature response has been detected, and the sensibility of frequency with respect to voltage variations is greater than the measured in previous works. A quadratic polynomial function fits better the sensor response, and an increment in the number of inverters in the oscillator is effective to reduce the voltage sensibility.

show abstract

Thermal monitoring on FPGAs using ring-oscillators

Cited by 46 publications

References 2 publications

A Novel Technique for Ring Oscillator Based PUFs to Enroll Stable Challenge Response Pairs

A Novel Technique for Ring Oscillator Based PUFs to Enroll Stable Challenge Response Pairs

Thermal verification on FPGAs

Ring oscillators as thermal sensors in FPGAs: Experiments in low voltage

Contact Info

Product

Resources

About