2009
DOI: 10.1109/tcapt.2008.2004578
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Thermal Measurement and Modeling of Multi-Die Packages

Abstract: Thermal measurement and modeling of multi-die packages with vertical (stacked) and lateral arrangement became a hot topic recently in different fields like RAM chip packaging or LEDs and LED assemblies. In our present study we present results for a more complex structure: an opto-coupler device with 4 chips in a combined lateral and vertical arrangement. The paper gives an overview of measurement and modeling techniques and results for stacked and MCM structures. It describes actual measurement results along w… Show more

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Cited by 85 publications
(24 citation statements)
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“…[6,24]. On the level of the discretized model of a system, however, where every heat-source and every monitoring location is point-like, the network model is completely reciprocal, therefore distinction in naming the two nodes associated with ″input″ and ″output″ side of a thermal transfer impedance (transfer function) is not necessary, we simply call these terminal nodes as ports.…”
Section: Sunred Algorithm With Transfer Functions Representing Thermamentioning
confidence: 99%
See 1 more Smart Citation
“…[6,24]. On the level of the discretized model of a system, however, where every heat-source and every monitoring location is point-like, the network model is completely reciprocal, therefore distinction in naming the two nodes associated with ″input″ and ″output″ side of a thermal transfer impedance (transfer function) is not necessary, we simply call these terminal nodes as ports.…”
Section: Sunred Algorithm With Transfer Functions Representing Thermamentioning
confidence: 99%
“…despite some efforts aimed at modeling stacked die IC packages [6] the lack of ability of describing multi-heat source packages. Another problem of the DELPHI model is that it is a steady-state model.…”
Section: Introductionmentioning
confidence: 99%
“…During the last decades, significant results have been achieved in terms of construction of Dynamic Compact Thermal Models (DCTMs) of electronic components and packages [1], [2].…”
Section: Introductionmentioning
confidence: 99%
“…Usually the matrix is extracted either from experimental measurements [14], [15] or by refined three-dimensional thermal simulations. Alternative extraction methods based on Finite Difference Methods (FDM) are quite diffused in literature [15] and some of them exploit Model Order Reduction (MOR) methods together with Generalized Minimized Residual (GMRES) algorithms for solving heat equations [17]. Among the refined three-dimensional simulation techniques, the numerical computation approach through Finite Element Methods (FEMs) is the most diffused [18].…”
Section: Introductionmentioning
confidence: 99%