1991
DOI: 10.1007/bf00534224
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Thermal expansion of high-T c superconductors

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Cited by 16 publications
(4 citation statements)
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“…where j x (t) is the electric current density at depth x from the top surface, j 0 (t) is the electric current density at the top surface, x is the distance from the top surface and d is the depth of electric current penetration. d is given by the expression 19 d~(r=pf m 0 m r ) 1=2…”
Section: Basic Theoriesmentioning
confidence: 99%
See 1 more Smart Citation
“…where j x (t) is the electric current density at depth x from the top surface, j 0 (t) is the electric current density at the top surface, x is the distance from the top surface and d is the depth of electric current penetration. d is given by the expression 19 d~(r=pf m 0 m r ) 1=2…”
Section: Basic Theoriesmentioning
confidence: 99%
“…The current density distribution can be represented as follows 18 where j x ( t ) is the electric current density at depth x from the top surface, j 0 ( t ) is the electric current density at the top surface, x is the distance from the top surface and δ is the depth of electric current penetration. δ is given by the expression 19 where f is the frequency of the electric current, μ 0 is the magnetic susceptibility in a vacuum and μ r = 1 is the relative magnetic susceptibility.…”
Section: Basic Theoriesmentioning
confidence: 99%
“…The reduction or disappearance of the (020) Bi2212 peak demonstrates that the epitaxy of the Bi2212 films sintered at lower sintering temperature has been improved. At the higher sintering temperature, the epitaxial orientation of Bi2212 films grown on MgO substrates is deteriorated owing to the effect of thermal stress between film and substrate (White et al, 1991). This is because the stress increases with increasing temperature and accelerating cooling rate (the curve of the cooling rate is shown in Fig.…”
Section: Figurementioning
confidence: 99%
“…Sugano et al [4] measured the thermal expansion of Ag tape by double extensometers between 290 and 5 K. As a result, the thermal expansion curves were confirmed during both the cooling and warming processes to show good agreement with each other for Ag plates with thickness of 3, 1, and 0.2 mm, and the samples' thermal expansion was calculated by a step of 1 K. Using the two-dimensional reciprocal-lattice method of x-ray diffraction, Asahi et al [5] reported the thermal expansion of superconducting Bi-tape in the temperature range between 15 and 300 K. Bagrets et al [6] presented measurements of the thermal conductivity and expansion of the structural materials used for the production of the Rutherford cables in the temperature range from 4 to 300 K. In consideration of polymers, Esposito et al [7] estimated the thermal expansion coefficient of samples using coating of fiber Bragg grating sensors in the temperature range from 4 to 300 K. Numerical models have been proposed to illustrate the tested results. Although some of measurement techniques have been suggested for evaluating the thermal expansion of superconductors [8][9][10], the most measurements on the low-temperature thermal expansion were mainly conducted at randomized temperature variation which can affect the accuracy of sensors. For optimizing superconducting materials and magnets on the viewpoint of engineering design, tensile mechanical properties of superconducting composites at variable cryogenic temperature also come into tremendous notice [11].…”
Section: Introductionmentioning
confidence: 99%