Thermal Evaluation of 28-nm p-type FD-SOI MOSFETs

Rossetto, Alan; Soares, Caroline; Wirth, Gilson; Pavanello, Marcelo; Wang, Ziyi; Vasileska, Dragica

doi:10.1109/laedc58183.2023.10209116

2023 IEEE Latin American Electron Devices Conference (LAEDC) 2023

DOI: 10.1109/laedc58183.2023.10209116

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Thermal Evaluation of 28-nm p-type FD-SOI MOSFETs

Alan Rossetto,

Caroline Soares,

Gilson Wirth

et al.

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Thermal Evaluation of 28-nm p-type FD-SOI MOSFETs

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References 14 publications

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