1992
DOI: 10.1007/bf00348127
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Thermal diffusivities measured by photodisplacement detection of transient thermal gratings

Abstract: Abstract. Laser-induced transient thermal gratings generated on polycrystalline copper and nickel surfaces were measured by photothermal displacement techniques. The goal was to test the potential of this method for determining thermal diffusivities. It is shown that the literature bulk values of the thermal diffusivities are reproduced by a simplified description of the time decay of the grating in terms of a superposition of decoupled lateral and vertical decay rates. 44.50.+t, 65.70.+y Transient thermal … Show more

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Cited by 15 publications
(4 citation statements)
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“…Its gradient, evaluated according to Eq. (l) and [4], implies an effective thermal diffusivity of 9 . 0~1 0~~m~s~' , which is entirely plausible, though somewhat higher than that of common glasses (eg D~.…”
Section: Glassmentioning
confidence: 99%
“…Its gradient, evaluated according to Eq. (l) and [4], implies an effective thermal diffusivity of 9 . 0~1 0~~m~s~' , which is entirely plausible, though somewhat higher than that of common glasses (eg D~.…”
Section: Glassmentioning
confidence: 99%
“…In the course of the thermal grating decay, heat is transferred over a distance between the peaks and nulls of the grating that can be varied typically from a fraction of a micron to tens of microns. 5 Hitherto transient gratings have been successfully used to measure thermal diffusivity of bulk materials [6][7][8] and thin films. [9][10][11] In metals with high electron mobility such as gold and copper, thermal conductivity is proportional to electrical conductivity 12 and thus, the transient grating technique can be used for noncontact monitoring of the electrical resistivity of thin metal films, an application that has shown promise for process control in microelectronics.…”
Section: Introductionmentioning
confidence: 99%
“…: (PADDOCK;EESLEY, 1986a;CAHILL, 2004;WILSON et al, 2012;HUANG et al, 2011;TAM, 1995) Deformação de superfície (Surface deflection, Photodisplacement) REF. : (AMERI et al, 1981;MIRANDA, 1983;JÁUREGUI;MATTHIAS, 1992 Haupin, no mesmo ano, propôs um instrumento baseado no HWM para medição rápida de materiais sólidos isolantes. Naquele aparato uma junção de termopar foi colocada no centro da amostra e possuía duas funções, a de fonte de calor, pois era aquecida por meio da aplicação de uma corrente alternada, e a de termômetro, na medição da temperatura.…”
Section: Métodos Com Contato (Contact Methods)unclassified