Thermal Conductivity of Electron-Irradiated Silicon

Vook, F. L.

doi:10.1103/physrev.140.a2014

Cited by 12 publications

(2 citation statements)

References 32 publications

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“…31͒, and the solid line represents measurements of a sample with a higher defect concentration. 32 These results by Vook et al, measured on a sample that has been irradiated with electrons, fit very well to our data. We have to assume that a rather high defect concentration has been introduced in the Si wafer by preparation of the wafer, e.g., sawing and polishing.…”

Section: Fem Calculationssupporting

confidence: 91%

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Thermal conductivity and diffusivity measurements in the sub-μm and sub-μs scale on centimeter area samples using a microthermocouple

Forster

Gmelin

1996

Review of Scientific Instruments

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Section: Fem Calculationssupporting

confidence: 91%

“…This significantly reduces the mean free path of the phonons to the same amount as for the irradiated sample used in Ref. 32. Unfortunately, we did not find any other comparable heat conductivity data for Si thin films in the literature.…”

Section: Fem Calculationsmentioning

confidence: 75%

Thermal conductivity and diffusivity measurements in the sub-μm and sub-μs scale on centimeter area samples using a microthermocouple

Forster

Gmelin

1996

Review of Scientific Instruments

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Correlation of thermal conductivity of non-metallic solids at low temperatures

Cezairliyan

Nalbantyan

1971

Phys. Stat. Sol. (a)

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Thermal conductivity of selected non-metallic and semi-metallic solids is correlated at low temperatures, 0 < T < 1.5 T,, where T , is the temperature corresponding to the thermal conductivity maxima. These include the elements Bi, Ge, Se, Si, Te, and certain carbides and chlorides. It is shown that for most substances reduced thermal conductivity A* (A* = #Arn, where A, is the maximum thermal conductivity) may be represented as a unique function of reduced temperature T* (T* = TIT,), independent of impurity and imperfection content. Exceptions to the above are discussed. Variations of thermal conductivity maxima as a function of temperature are discussed. Reduced thermal conductivity ,f non-metallic solide is compared with that of metals at low temperatures. Die thermische Leitfahigkeit von ausgewiihlten nichtmetallischen und semimetallischenFestkorpern ist bei niedrigen Temperaturen, 0 < T < 1,5 T,, wobei T , die den thermischen Leitfiihigkeitsmexima entsprechende Temperatur ist, korreliert. Davon sind die Elemente Bi, Ge, Se, Si, Te und gewisse Karbide und Chloride betroffen. Es wird gezeigt, daB fur die meisten Substanzen die reduzierte thermische Leitfiihigkeit il*(l* = A/&,, wobei A, die maximale thermische Leitfiihigkeit ist) durch eine einzige Funktion mit reduzierter Temperatur T* (T* = T / T m ) dargestellt werden kann, unabhangig vom Verunreinigungs-und Defektgehalt. Ausnahmen hiervon werden diskutiert. Anderungen der thermischen Leitfahigkeitsmaxima als Funktion der Temperatur werden ebenfalls diskutiert. Die reduzierte thermische Leitfiihigkeit nichtmetallischer Festkorper wird mit der von Metallen bei niedrigen Temperaturen verglichen.

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Low-temperature thermal conductivity studies on silicon irradiated with fast neutrons at 80�K

Seyfert¹

1970

J Low Temp Phys

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Thermal Conductivity of Electron-Irradiated Silicon

Cited by 12 publications

References 32 publications

Thermal conductivity and diffusivity measurements in the sub-μm and sub-μs scale on centimeter area samples using a microthermocouple

Thermal conductivity and diffusivity measurements in the sub-μm and sub-μs scale on centimeter area samples using a microthermocouple

Correlation of thermal conductivity of non-metallic solids at low temperatures

Low-temperature thermal conductivity studies on silicon irradiated with fast neutrons at 80�K

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