1992
DOI: 10.1007/bf00348399
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Thermal conductivity and interface thermal resistance of Si film on Si substrate determined by photothermal displacement interferometry

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Cited by 59 publications
(25 citation statements)
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“…The predicted thermal conductivity accumulation demonstrates that the propagating contribution is negligible in our model, which is in accord with the experimental measurements. (b) Predicted thermal conductivity accumulation function for a-Si compared with experimental measurements by Regner et al and thin films fabricated by sputtering (Experiment A) [5,31,32] and chemical vapor deposition (Experiment B) [7,8,30,33]. The predicted thermal conductivity accumulation demonstrates that the propagating contribution is significant for a-Si.…”
Section: A Bulkmentioning
confidence: 86%
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“…The predicted thermal conductivity accumulation demonstrates that the propagating contribution is negligible in our model, which is in accord with the experimental measurements. (b) Predicted thermal conductivity accumulation function for a-Si compared with experimental measurements by Regner et al and thin films fabricated by sputtering (Experiment A) [5,31,32] and chemical vapor deposition (Experiment B) [7,8,30,33]. The predicted thermal conductivity accumulation demonstrates that the propagating contribution is significant for a-Si.…”
Section: A Bulkmentioning
confidence: 86%
“…7(a) and 7(b) are experimental measurements of thin-film thermal conductivities. For a-Si, the experimental measurements are broadly grouped by sample preparation technique: (A) chemical vapor deposition [7,8,33] and (B) sputtering [5,31,32].…”
Section: B Accumulation Functionmentioning
confidence: 99%
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“…25 Moreover, through phonon scattering at interfaces, boundaries and imperfections, the nano-scale heterojunctions allow charge transport through tunneling and minimize the thermal conductivities. [26][27][28][29] By applying the conducting polymer in the low dimensional hybrids, the thermal conductivity can be largely reduced, while still permitting high electrical conductivity resulting in the enhancement of the figure of merit. The surface polarization has also been demonstrated as an additional driving force to diffuse charge carriers in vertical hybrid architecture for the development of Seebeck effects.…”
mentioning
confidence: 99%
“…Petrovsky et al (1992) studied the influence of carrier recombination on the pulsed photothermal beam deflection signal in semiconductors, while Surnev and Ivanov (1992) investigated the thermal diffusivity measurements in semiconductors and the influence of the carrier diffusion and recombination. Kuo et al (1992) studied the thermal conductivity and interface thermal resistance of Si film on Si substrate determined by photothermal displacement interferometry. On the other hand, Fournier et al (1986) studied the theoretical and experimental of photothermal investigation of transport in semiconductors.…”
Section: Introductionmentioning
confidence: 99%